censored data;
empirical mean residual life process;
Kaplan-Meier estimate;
Susarla-Van Ryzim estimate;
D O I:
10.1080/03610920008832620
中图分类号:
O21 [概率论与数理统计];
C8 [统计学];
学科分类号:
020208 ;
070103 ;
0714 ;
摘要:
There are two mean residual life estimates for right censored data. One is based on the Kaplan-Meier estimate, the other, based on the Susarla-Van Ryzin estimate for survival function. In this paper, we define the empirical mean residual life process for right censored data and show that the two empirical mean residual life processes based on the Kaplan-Meier and Susarla-Van Ryzin estimates are asymptotically equivalent uniformly on an interval under some conditions. Also we discuss the case which the asymptotic equivalence might fail.
机构:
Univ Autonoma Madrid, Dept Matemat, Francisco Tomas & Valiente 7, E-28049 Madrid, SpainUniv Autonoma Madrid, Dept Matemat, Francisco Tomas & Valiente 7, E-28049 Madrid, Spain
Fernandez, Jose L.
Ferri, Enrico
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h-index: 0
机构:
Fac Informat, Dept Math, Campus Elvina S-N, La Coruna 15071, SpainUniv Autonoma Madrid, Dept Matemat, Francisco Tomas & Valiente 7, E-28049 Madrid, Spain
Ferri, Enrico
Vazquez, Carlos
论文数: 0引用数: 0
h-index: 0
机构:
Fac Informat, Dept Math, Campus Elvina S-N, La Coruna 15071, SpainUniv Autonoma Madrid, Dept Matemat, Francisco Tomas & Valiente 7, E-28049 Madrid, Spain