Asymptotic equivalence between two empirical mean residual life processes

被引：3
|
作者：
Park, HI
Park, JS
Lee, SJ
机构：
[1] Chong Ju Univ, Dept Stat, Choong Book 360764, South Korea
[2] Chong Ju Univ, Dept Ind Engn, Choong Book 360764, South Korea
来源：
COMMUNICATIONS IN STATISTICS-THEORY AND METHODS | 2000年 / 29卷 / 11期
关键词：
censored data; empirical mean residual life process; Kaplan-Meier estimate; Susarla-Van Ryzim estimate;
D O I：
10.1080/03610920008832620
中图分类号：
O21 [概率论与数理统计]; C8 [统计学];
学科分类号：
020208 ; 070103 ; 0714 ;
摘要：
There are two mean residual life estimates for right censored data. One is based on the Kaplan-Meier estimate, the other, based on the Susarla-Van Ryzin estimate for survival function. In this paper, we define the empirical mean residual life process for right censored data and show that the two empirical mean residual life processes based on the Kaplan-Meier and Susarla-Van Ryzin estimates are asymptotically equivalent uniformly on an interval under some conditions. Also we discuss the case which the asymptotic equivalence might fail.
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页码：2523 / 2533
页数：11
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