Enhancement of resolution of DNA on silylated mica using atomic force microscopy

被引:13
|
作者
Tang, J [1 ]
Li, JW [1 ]
Wang, C [1 ]
Bai, CL [1 ]
机构
[1] Chinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China
来源
关键词
D O I
10.1116/1.1305270
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
It is demonstrated that the mica surface covered with a nanometer-thick, well connected silane film can appreciably improve the lateral resolution of DNA molecules in comparison with that on bare mica using atomic force microscopy. A typical value width of 4 nm can be obtained. We propose that the nanometer dimensioned porous surface provides an approach to eliminate the hydrated salt layer associated with the condensation of DNA strands, and leads to the enhancement of lateral resolution. (C) 2000 American Vacuum Society. [S0733-211X(00)02904-8].
引用
收藏
页码:1858 / 1860
页数:3
相关论文
共 50 条
  • [41] Atomic force microscopy imaging of single ion impacts on mica
    Parks, DC
    Bastasz, R
    Schmieder, RW
    Stockli, M
    ATOMIC FORCE MICROSCOPY/SCANNING TUNNELING MICROSCOPY 2, 1997, : 161 - 168
  • [42] Liposome adhesion on mica surface studied by atomic force microscopy
    Egawa, H
    Furusawa, K
    LANGMUIR, 1999, 15 (05) : 1660 - 1666
  • [43] Observing nucleation dynamics at the mica-water interface with molecular-resolution atomic force microscopy
    Legg, Benjamin
    Mundy, Christopher
    Baer, Marcel
    De Yoreo, James
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2018, 256
  • [44] Porphyrins on mica: Atomic force microscopy imaging in organic solvents
    Honda, Hirotaka
    Sasahara, Akira
    Onishi, Hiroshi
    COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS, 2019, 561 : 194 - 200
  • [45] Simulation of atomic force microscopy images of cleaved mica surfaces
    Tsujimichi, K
    Tamura, H
    Hirotani, A
    Kubo, M
    Komiyama, M
    Miyamoto, A
    JOURNAL OF PHYSICAL CHEMISTRY B, 1997, 101 (21): : 4260 - 4264
  • [46] ATOMIC RESOLUTION IMAGING OF A NONCONDUCTOR BY ATOMIC FORCE MICROSCOPY
    ALBRECHT, TR
    QUATE, CF
    JOURNAL OF APPLIED PHYSICS, 1987, 62 (07) : 2599 - 2602
  • [47] Atomic force microscopy characterization of β-casein nanoparticles on mica and graphite
    Sinitsyna, Olga V.
    Vorob'ev, Mikhail M.
    MENDELEEV COMMUNICATIONS, 2021, 31 (01) : 88 - 90
  • [48] ATOMIC RESOLUTION ON LIF (001) BY ATOMIC FORCE MICROSCOPY
    MEYER, E
    HEINZELMANN, H
    RUDIN, H
    GUNTHERODT, HJ
    ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1990, 79 (01): : 3 - 4
  • [49] Investigation of radiation damage in DNA by using atomic force microscopy
    Boichot, S
    Fromm, M
    Cunniffe, S
    O'Neill, P
    Labrune, JC
    Chambaudet, A
    Delain, E
    Le Cam, E
    RADIATION PROTECTION DOSIMETRY, 2002, 99 (1-4) : 143 - 145
  • [50] High-resolution atomic force microscopy of duplex and triplex DNA molecules
    Klinov, Dmitry
    Dwir, Benjamin
    Kapon, Eli
    Borovok, Natalia
    Molotsky, Tatiana
    Kotlyar, Alexander
    NANOTECHNOLOGY, 2007, 18 (22)