Laser-induced nano-corrugation of a dielectric surface

被引：0
|
作者：
Kaplan, A. E. [1 ]
Volkov, S. N. [1 ]
机构：
[1] Johns Hopkins Univ, Dept Elect & Comp Engn, Baltimore, MD 21218 USA
来源：
2009 CONFERENCE ON LASERS AND ELECTRO-OPTICS AND QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (CLEO/QELS 2009), VOLS 1-5 | 2009年
关键词：
DAMAGE;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We demonstrate that uneven distribution of evanescent field and sub-threshold ablation at a dielectric surface can explain experimentally observed creation of nanometer-sized surface grooves by femtosecond laser pulses. (C) 2009 Optical Society of America
引用
收藏
页码：950 / 951
页数：2
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