Evaluation of the radiation hazard for ion-beam analysis with MeV external proton beams (X-IBA)

被引:5
|
作者
Hofsaess, Hans [1 ]
机构
[1] Univ Gottingen, Inst Phys 2, Friedrich Hund Pl 1, D-37077 Gottingen, Germany
关键词
Radiation hazard; Activation; Radionuclide production; External beam; Protons; PIXE; RBS; MeV; BOMBARDMENT;
D O I
10.1016/j.nimb.2018.04.037
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
MeV ion beams which are extracted into air or He atmosphere are used in many labs for proton-induced X-ray emission (PIXE), proton induced gamma ray emission (PIGE) or Rutherford backscattering (RBS) to analyze samples which are difficult or impossible to handle in vacuum. When MeV proton beams are extracted into air through thin Kapton foils or nowadays thin silicon nitride membranes, the protons will interact with air, as well as elements present in the analyzed samples. Typically the range of MeV protons in air is several cm, in Helium atmosphere several 10 cm and in human skin around 100 mu m. Besides the severe radiation hazard in case of a direct exposure of skin with protons, there are a manifold of nuclear reactions or inelastic proton scattering processes which may cause activation of air and target materials but also prompt radiation. The radiation hazard associated with the direct and scattered beam, nuclear reaction products and radionuclide production in air have been discussed in a publication by Doyle et al. in 1991 which was used as a reference in several later publications. I have reevaluated the radiation hazards for external proton beams with up to 4.5 MeV using proton reaction cross sections taken from the JANIS book of proton induced cross sections. The radionuclide production in air is about 3 orders of magnitude lower compared to values given in the 1991 publication. Radionuclide production as well as generation of prompt alpha, gamma and neutron radiation in target materials for elements up to molybdenum is also evaluated.
引用
收藏
页码:53 / 59
页数:7
相关论文
共 50 条
  • [41] MeV single-ion beam irradiation of mammalian cells using the Surrey vertical nanobeam, compared with broad proton beam and X-ray irradiations
    Prakrajang, K.
    Jeynes, J. C. G.
    Merchant, M. J.
    Kirkby, K.
    Kirkby, N.
    Thopan, P.
    Yu, L. D.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2013, 307 : 586 - 591
  • [42] THIN-FILM DEPOSITION USING LOW-ENERGY ION-BEAMS .2. PB+ ION-BEAM DEPOSITION AND ANALYSIS OF DEPOSITS
    AMANO, J
    LAWSON, RPW
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1977, 14 (02): : 690 - 694
  • [43] EVALUATION OF THIN-FILMS FABRICATED BY LOW-ENERGY DIRECT ION-BEAM DEPOSITION FOR SOFT X-RAYS
    ITO, K
    YONEMITSU, T
    ETOH, K
    SEKIGUCHI, H
    YAMADA, I
    KATAOKA, I
    DURAND, HA
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 59 : 321 - 325
  • [44] THIN-FILM DEPOSITION USING LOW-ENERGY ION-BEAMS .2. PB+ ION-BEAM DEPOSITION AND ANALYSIS OF DEPOSITS
    AMANO, J
    LAWSON, RPW
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1977, 14 (03): : 831 - 835
  • [45] Nanoscale ion-beam mixing of Ti/Si interfaces: An X-ray photoelectron spectroscopy and factor analysis study
    Palacio, C
    Arranz, A
    SURFACE SCIENCE, 2005, 578 (1-3) : 71 - 79
  • [46] ANALYSIS OF BORON PRE-DEPOSITED SILICON WAFERS BY COMBINED ION-BEAM TECHNIQUES AND X-RAY MICROANALYSIS
    ARMIGLIATO, A
    BENTINI, GG
    RUFFINI, G
    BATTAGLIN, G
    DELLAMEA, G
    DRIGO, AV
    NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 653 - 658
  • [47] LAYER STRUCTURE EVALUATION OF MULTILAYER X-RAY MIRROR BY COMBINATION OF FOCUSED ION-BEAM ETCHING AND TRANSMISSION ELECTRON-MICROSCOPY
    NAKAJIMA, K
    SUDO, S
    YAKUSHIJI, M
    ISHII, T
    AOKI, S
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1993, 11 (06): : 2127 - 2129
  • [48] Comparative analysis of the immune responses in cancer cells irradiated with X-ray, proton and carbon-ion beams
    Du, Junyan
    Kageyama, Shun-Ichiro
    Hirata, Hidenari
    Motegi, Atsushi
    Nakamura, Masaki
    Hirano, Yasuhiro
    Okumura, Masayuki
    Yamashita, Riu
    Tsuchihara, Katsuya
    Hojo, Hidehiro
    Hirayama, Ryoichi
    Akimoto, Tetsuo
    BIOCHEMICAL AND BIOPHYSICAL RESEARCH COMMUNICATIONS, 2021, 585 : 55 - 60
  • [49] X-RAY-DIFFRACTION PEAK PROFILE ANALYSIS OF TINX FILMS PREPARED ON SILICON BY REACTIVE ION-BEAM ASSISTED DEPOSITION
    SCARDI, P
    KOTHARI, DC
    GUZMAN, L
    THIN SOLID FILMS, 1991, 195 (1-2) : 213 - 223
  • [50] Magnetometric Analysis of Surface Layers of 12X18H10T Steel After Ion-Beam Nitriding
    Duryagina, Z. A.
    Bespalov, S. A.
    Borysyuk, A. K.
    Pidkova, V. Ya.
    METALLOFIZIKA I NOVEISHIE TEKHNOLOGII, 2011, 33 (05): : 615 - 622