Can Functional Test Achieve Low-cost Full Coverage of NoC Faults?

被引：0
|
作者：
Lubaszewski, Marcelo [1 ]
机构：
[1] Univ Fed Rio Grande do Sul, Dept Elect Engn, Porto Alegre, RS, Brazil
来源：
IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE VLSI SYSTEMS, PROCEEDINGS | 2009年
关键词：
D O I：
10.1109/DFT.2009.62
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
引用
收藏
页码：224 / 224
页数：1
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