Can Functional Test Achieve Low-cost Full Coverage of NoC Faults?

被引：0
|
作者：
Lubaszewski, Marcelo [1 ]
机构：
[1] Univ Fed Rio Grande do Sul, Dept Elect Engn, Porto Alegre, RS, Brazil
来源：
IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE VLSI SYSTEMS, PROCEEDINGS | 2009年
关键词：
D O I：
10.1109/DFT.2009.62
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
引用
收藏
页码：224 / 224
页数：1
相关论文
共 50 条
  • [1] How can we achieve universal access to low-cost treatment for HIV?
    Hill, Andrew M.
    Pozniak, Anton L.
    [J]. JOURNAL OF VIRUS ERADICATION, 2016, 2 (04) : 193 - 197
  • [2] The demand for health insurance coverage by low-income workers: Can reduced premiums achieve full coverage?
    Chernew, M
    Frick, K
    McLaughlin, CG
    [J]. HEALTH SERVICES RESEARCH, 1997, 32 (04) : 453 - 470
  • [3] A Low-Cost Conflict-Free NoC for GPGPUs
    Zhao, Xia
    Ma, Sheng
    Liu, Yuxi
    Eeckhout, Lieven
    Wang, Zhiying
    [J]. 2016 ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC), 2016,
  • [4] A low-cost telescope for enhanced stimulus visual field coverage in functional MRI
    Jolly, Jasleen K.
    Sheldon, Aislin A.
    Alvarez, Ivan
    Gallagher, Chris
    MacLaren, Robert E.
    Bridge, Holly
    [J]. JOURNAL OF NEUROSCIENCE METHODS, 2021, 350
  • [5] Strategies for low-cost test
    Kapur, R
    Chandramouli, R
    Williams, TW
    [J]. IEEE DESIGN & TEST OF COMPUTERS, 2001, 18 (06): : 47 - 54
  • [6] A Low-Cost and Energy-Efficient NoC Architecture for GPGPUs
    Cheng, Xianwei
    Zhao, Yang
    Robaei, Mohammadreza
    Jiang, Beilei
    Zhao, Hui
    Fang, Juan
    [J]. 2019 ACM/IEEE SYMPOSIUM ON ARCHITECTURES FOR NETWORKING AND COMMUNICATIONS SYSTEMS (ANCS), 2019,
  • [7] LOW-COST TO PROVIDE FULL INSURANCE-COVERAGE FOR SEVERELY DEVELOPMENTALLY DISABLED-CHILDREN
    GUYOT, D
    BIRENBAUM, A
    COHEN, HJ
    [J]. PEDIATRIC RESEARCH, 1989, 25 (04) : A100 - A100
  • [8] Lowering cost of test: Parallel test or low-cost ATE?
    Rivoir, J
    [J]. ATS 2003: 12TH ASIAN TEST SYMPOSIUM, PROCEEDINGS, 2003, : 360 - 363
  • [9] MICROMACHINED BOLOMETER ARRAYS ACHIEVE LOW-COST IMAGING
    WOOD, RA
    FOSS, NA
    [J]. LASER FOCUS WORLD, 1993, 29 (06): : 101 - 106
  • [10] A NEW LOW-COST WAY TO FIND IC FAULTS
    GOSCH, J
    [J]. ELECTRONICS, 1987, 60 (23): : 33 - 33
12345