Quantifying non-contact tip-sample thermal exchange parameters for accurate scanning thermal microscopy with heated microprobes

被引:20
|
作者
Wilson, Adam A. [1 ]
Borca-Tasciuc, Theodorian [1 ]
机构
[1] Rensselaer Polytech Inst, Dept Mech Aerosp & Nucl Engn, 110 8th St, Troy, NY 12180 USA
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2017年 / 88卷 / 07期
关键词
TRANSPORT-PROPERTIES; CONDUCTIVITY; AIR; CALIBRATION; MECHANISMS; NANOWIRES; PROBE; FILMS;
D O I
10.1063/1.4991017
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Simplified heat-transfer models are widely employed by heated probe scanning thermal microscopy techniques for determining thermal conductivity of test samples. These parameters have generally been assumed to be independent of sample properties; however, there has been little investigation of this assumption in non-contact mode, and the impact calibration procedures have on sample thermal conductivity results has not been explored. However, there has been little investigation of the commonly used assumption that thermal exchange parameters are sample independent in non-contact mode, or of the impact calibration procedures have on sample thermal conductivity results. This article establishes conditions under which quantitative, localized, non-contact measurements using scanning thermal microscopy with heated microprobes may be most accurately performed. The work employs a three-dimensional finite element (3DFE) model validated using experimental results and no fitting parameters, to determine the dependence of a heated microprobe thermal resistance as a function of sample thermal conductivity at several values of probe-to-sample clearance. The two unknown thermal exchange parameters were determined by fitting the 3DFE simulated probe thermal resistance with the predictions of a simplified probe heat transfer model, for two samples with different thermal conductivities. This calibration procedure known in experiments as the intersection method was simulated for sample thermal conductivities in the range of 0.1-50 W m(-1) K-1 and clearance values in the 260-1010 nm range. For a typical Wollaston wire microprobe geometry as simulated here, both the thermal exchange radius and thermal contact resistance were found to increase with the sample thermal conductivity in the low thermal conductivity range while they remained approximately constant for thermal conductivities > 1 W m(-1) K-1, with similar trends reported for all clearance values investigated. It is shown that versatile sets of calibration samples for the intersection method should employ either medium range (1 W m(-1) K-1) and (2 W m(-1) K-1) thermal conductivities, or wide range (0.5 W m(-1) K-1) and (50 W m(-1) K-1). The medium range yielded results within 1.5%-20.4% of the expected values of thermal conductivity for specimens with thermal conductivity within 0.1-10 W m(-1) K-1, while the wide range yielded values within 0.5%-19.4% in the same range. Published by AIP Publishing.
引用
收藏
页数:10
相关论文
共 33 条
  • [21] Realizing the Accurate Measurements of Thermal Conductivity over a Wide Range by Scanning Thermal Microscopy Combined with Quantitative Prediction of Thermal Contact Resistance
    Zhang, Qingqing
    Zhu, Wei
    Zhou, Jie
    Deng, Yuan
    SMALL, 2023, 19 (32)
  • [22] Scanning force microscopy study of patterned monolayers of alkanethiols on gold. Importance of tip-sample contact area in interpreting force modulation and friction force microscopy images
    Bar, G
    Rubin, S
    Parikh, AN
    Swanson, BI
    Zawodzinski, TA
    Whangbo, MH
    LANGMUIR, 1997, 13 (03) : 373 - 377
  • [23] Accurate Non-Contact Body Temperature Measurement with Thermal Camera under Varying Environment Conditions
    Song, Changhoon
    Lee, Sukhan
    PROCEEDINGS OF THE 2022 16TH INTERNATIONAL CONFERENCE ON UBIQUITOUS INFORMATION MANAGEMENT AND COMMUNICATION (IMCOM 2022), 2022,
  • [24] Non-contact, portable, and stand-off infrared thermal imager for security scanning applications
    Khor, Weeliam
    Chen, Yichen Kelly
    Roberts, Michael
    Ciampa, Francesco
    AIP ADVANCES, 2024, 14 (04)
  • [25] Non-optical tip-sample distance control method for scanning near-field optical microscopy using a piezoresistive micro cantilever
    Muramatsu, H
    Egawa, A
    Homma, K
    Kim, JM
    Takahashi, H
    Shirakawabe, Y
    Shimizu, N
    JOURNAL OF MICROSCOPY-OXFORD, 2001, 202 : 154 - 161
  • [26] A novel non-optical method of tip-sample distance regulation based on shear force in scanning near-field optical microscopy
    Liu, XM
    Wang, J
    Li, DC
    OPTICAL ENGINEERING FOR SENSING AND NANOTECHNOLOGY (ICOSN'99), 1999, 3740 : 307 - 309
  • [27] A non-contact, thermal noise based method for the calibration of lateral deflection sensitivity in atomic force microscopy
    Mullin, Nic
    Hobbs, Jamie K.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2014, 85 (11):
  • [28] Investigation of contact thermal resistance at the probe-sample interface in scanning thermal microscopy based on the fractal network model through numerical analysis
    Li, Yifan
    Zhang, Yuan
    Xiong, Xiaojun
    Yu, Wei
    NUMERICAL HEAT TRANSFER PART A-APPLICATIONS, 2023,
  • [29] Ex Situ and In Situ Thermal Transformations of M-50 Pitch Revealed by Non-contact Atomic Force Microscopy
    Chen, Pengcheng
    Metz, Jordan N.
    Gross, Adam S.
    Smith, Stuart E.
    Rucker, Steven P.
    Yao, Nan
    Zhang, Yunlong
    ENERGY & FUELS, 2021, 35 (22) : 18210 - 18219
  • [30] Non-contact photopyroelectric method applied to thermal and optical characterization of textiles. Four-flux modeling of a scattering sample
    Limare, A
    Duvaut, T
    Henry, JF
    Bissieux, C
    INTERNATIONAL JOURNAL OF THERMAL SCIENCES, 2003, 42 (10) : 951 - 961