Integrated, Turnkey Modeling and Measurement Systems

被引：0

作者：

Yanagimoto, Yoshiyuki ^{[1
]}

Vye, David ^{[2
]}

Vanden Bossche, Marc ^{[2
]}

Dudkiewicz, Steve ^{[3
]}

Mallette, Vince ^{[4
]}

机构：

[1] Keysight Technol, Santa Rosa, CA USA

[2] Natl Instruments, Austin, TX USA

[3] Maury Microwave, Ontario, CA USA

[4] Focus Microwaves, Montreal, PQ, Canada

来源：

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：20 / +

页数：12

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