Integrated, Turnkey Modeling and Measurement Systems

被引：0
|
作者：
Yanagimoto, Yoshiyuki [1 ]
Vye, David [2 ]
Vanden Bossche, Marc [2 ]
Dudkiewicz, Steve [3 ]
Mallette, Vince [4 ]
机构：
[1] Keysight Technol, Santa Rosa, CA USA
[2] Natl Instruments, Austin, TX USA
[3] Maury Microwave, Ontario, CA USA
[4] Focus Microwaves, Montreal, PQ, Canada
来源：
MICROWAVE JOURNAL | 2016年 / 59卷 / 03期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：20 / +
页数：12
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