A Machine Learning Tool for Materials Informatics

被引:11
|
作者
Wang, Zhi-Lei [1 ]
Ogawa, Toshio [1 ]
Adachi, Yoshitaka [1 ]
机构
[1] Nagoya Univ, Dept Mat Sci & Engn, Chikusa Ku, Furo Cho, Nagoya, Aichi 4648601, Japan
关键词
image analysis; inverse analysis; machine learning; materials informatics; topological microstructures; DATA SCIENCE;
D O I
10.1002/adts.201900177
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
In response to the increasing demand for the highly efficient design of materials, materials informatics has been proposed for using data and computational sciences to extract data features that provide insight into how properties track with microstructure variables. However, the general metrics of microstructural features often ignore the complexities of the microstructure geometry for many properties of interest. An independently developed machine learning tool called shiny materials genome integration system for phase and property analysis (ShinyMIPHA), which is designed with either standalone software or cloud system based on an R programing package of "Shiny", is introduced. ShinyMIPHA provides topological microstructure analysis methods based on image processing technology by employing a two-point correlation function, persistent homology, and mean (H)-Gauss (K) curvature approaches, as well as sparse study and regression analysis methods that enable a data-driven properties-to-microstructure-to-processing inverse materials-design approach. The demo version is available at https://adachi- lab.shinyapps.io/demo/.
引用
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页数:7
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