In situ characterization of micron-scale particles by nuclear microscopy

Nuclear microscopy is well suited for analyzing large particle populations as well as individual particles of interest in various types of collection samples. Unlike some commonly used in situ techniques, nuclear microscopy can quantitatively characterize particles embedded within the sample or particles that are too small to be reliably removed from their collection media. Additional advantages include its capability for the detection of minor and trace elements, its capability to simultaneously analyze multiple elements with little or no prior sample preparation, and its potential for automated analyses. Preliminary data are presented of particle size and composition measurements conducted on air filters. The potential of applying nuclear microscopy to the cataloging of micron-scale cometary remnants captured in low density aerogel collectors is also explored. Because of its importance to a variety of collection programs, an innovative high-throughput ion beam imaging and analysis system is being jointly developed by Sandia and Lawrence Livermore national laboratories for rapid quantitative particle characterization. (C) 1997 Elsevier Science B.V.