Reflection high-energy electron diffraction and scanning tunneling microscopy study of InP(001) surface reconstructions

被引:24
|
作者
LaBella, VP [1 ]
Ding, Z [1 ]
Bullock, DW [1 ]
Emery, C [1 ]
Thibado, PM [1 ]
机构
[1] Univ Arkansas, Dept Phys, Fayetteville, AR 72701 USA
来源
关键词
D O I
10.1116/1.582373
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The reconstructions of the InP(001) surface prepared by molecular beam epitaxy have been studied with in situ reflection high-energy electron diffraction (RHEED) and scanning tunneling microscopy (STM). The growth chamber contains a highly accurate temperature measurement system and uses a solid-source, cracked phosphorus, valved effusion cell. Five InP(001) reconstructions are observed with RHEED by analyzing patterns in three principal directions. Under a fixed P-2 flux, decreasing the substrate temperature gives the following reconstructions: c(2 X 8), (2 X 4), (2 X 1), (2 X 2), and c(4 x 4). In situ STM images reveal that only two of these reconstructions yields long-range periodicity in real space. InP(001) does not form the metal rich (4 x 2) reconstruction, which is surprising because the (4 X 2) reconstruction has been coined the universal surface reconstruction since all III-V(001) surfaces were thought to favor its formation. (C) 2000 American Vacuum Society. [S0734-2101(00)05904-2].
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页码:1492 / 1496
页数:5
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