X-ray emission from aluminium under intense, ultrashort irradiation

被引:7
|
作者
Banerjee, S [1 ]
Kumar, GR [1 ]
Tribedi, LC [1 ]
机构
[1] Tata Inst Fundamental Res, Bombay 400005, Maharashtra, India
来源
EUROPEAN PHYSICAL JOURNAL D | 2000年 / 11卷 / 02期
关键词
D O I
10.1007/s100530070096
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present studies of X-ray emission from aluminium under picosecond and femtosecond irradiation in the intensity range similar to 10(12)-10(15) W cm(-2). We use a new and simple method to measure spectrally resolved absolute X-ray yields. It is shown that the X-ray yields can be obtained for arbitrary levels of X-ray flux. We present details of the variation of the absolute yields as a function of wavelength, intensity, polarization and pulse duration of the incident laser radiation. Electron temperatures in the keV range are observed at 10(15) W cm(-2) with femtosecond laser pulses.
引用
收藏
页码:295 / 300
页数:6
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