Silicon wafer backside thinning with mechanical and chemical method for better mechanical property

被引:0
|
作者
Jiang, Asen Long Xin [1 ]
Ming, Lai Chih [1 ]
Gao, Jeff Chen Yi [1 ]
Hwee, Tan Kim [1 ]
机构
[1] Jiangyin Changdian Adv Packaging Pte Ltd, 275 Binjiang Rd, Jiangsu 214431, Peoples R China
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A cheaper alternative method of Silicon wafer backside grinding and thinning, including the mechanical rough backside grinding and chemical polish was studied and conducted in JCAP (Jiangyin Changdian Advanced Package Co., LTD.) to respond to the trend of thinner chip for semi-conduct package. This study mainly focused on using different etchant to etch Silicon to release the stress caused by the mechanical grinding, in addition micro-crack from the mechanical back-grinding can be eliminated, the stress can increase the operational difficulty of thin wafer in the semiconductor assembly packaging process, such as SRD (Spin Rinse Dryer), transfer and handle. HNA(hydrofluoric and nitric diluted by acetic) was chosen as the etchant for silicon etching, because it is perfect and economical. For different application, there are different etch depths. After silicon etching, the wafer was cleaned with physical or chemical way, depending on the product property and function. Using this way, JCAP can achieve thinner than 100 mu m in 6 inches wafer and can be back metallized.
引用
收藏
页码:623 / +
页数:2
相关论文
共 50 条
  • [31] Mechanical behaviour and surface damage of silicon wafer
    Zhongnan Gongye Daxue Xuebao/Journal of Central South University of Technology, 29 (04): : 344 - 346
  • [32] Damage Evaluation of Wet-Chemical Si-Wafer Thinning/Backside Via Exposure Process
    Watanabe, Naoya
    Miyazaki, Takumi
    Yoshikawa, Kazuhiro
    Aoyagi, Masahiro
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2014, 4 (04): : 741 - 747
  • [33] Effect of cations on the improvement of material removal rate of silicon wafer in chemical mechanical polishing
    Xie, Wenxiang
    Zhang, Zhenyu
    Chen, Xin
    Yu, Shiqiang
    Shi, Chunjing
    Zhou, Hongxiu
    Wen, Wei
    COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS, 2023, 670
  • [34] Effects of suspending abrasives on the lubrication properties of slurry in chemical mechanical polishing of silicon wafer
    Liu, JY
    Jin, ZJ
    Guo, DM
    Kang, RK
    ADVANCES IN GRINDING AND ABRASIVE TECHNOLOGY XIII, 2006, 304-305 : 359 - 363
  • [35] Research on the hydrodynamic electro-chemical mechanical polishing for silicon wafer with suspension fluid
    Zhan, Jianming
    Zheng, Di
    ADVANCES IN GRINDING AND ABRASIVE TECHNOLOGY XIV, 2008, 359-360 : 290 - 294
  • [36] Investigation of material removal mechanism of silicon wafer in the chemical mechanical polishing process using molecular dynamics simulation method
    Xuesong Han
    Yuanzhong Hu
    Siyuan Yu
    Applied Physics A, 2009, 95 : 899 - 905
  • [37] Investigation of material removal mechanism of silicon wafer in the chemical mechanical polishing process using molecular dynamics simulation method
    Han, Xuesong
    Hu, Yuanzhong
    Yu, Siyuan
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2009, 95 (03): : 899 - 905
  • [38] Wafer Flatness Modeling in Chemical Mechanical Polishing
    Zhao, Chaoyue
    Li, Jianyong
    Yi, Defu
    Li, Baozhen
    Cao, Jianguo
    JOURNAL OF ELECTRONIC MATERIALS, 2020, 49 (01) : 353 - 363
  • [39] Wafer Flatness Modeling in Chemical Mechanical Polishing
    Chaoyue Zhao
    Jianyong Li
    Defu Yi
    Baozhen Li
    Jianguo Cao
    Journal of Electronic Materials, 2020, 49 : 353 - 363
  • [40] Wafer dimensional analysis for chemical mechanical planarization
    Zhang, Y
    Golubtsov, P
    Wagner, L
    Yin, X
    Parikh, P
    Stephenson, B
    SOLID STATE TECHNOLOGY, 1997, 40 (07) : 179 - &