Pattern analysis of international sorghum multi-environment trials for grain-yield adaptation

被引:24
|
作者
Alagarswamy, G [1 ]
Chandra, S [1 ]
机构
[1] Int Crops Res Inst Semi Arid Trop, Patancheru 502324, Andhra Pradesh, India
关键词
pattern analysis; yield adaptation; sorghum; genotype x environment interaction;
D O I
10.1007/s001220050755
中图分类号
S3 [农学(农艺学)];
学科分类号
0901 ;
摘要
Pattern analysis, which consists of joint and complementary use of classification and ordination techniques, was applied to grain-yield data of 12 sorghum genotypes in 25 environments to identify the grouping of genotypes and environments. The 12 genotypes represented a wide geographical origin, different genetic diversity, and three photoperiod-sensitive classes. The 25 environments represented a super population of widely different environments covering latitudes from 20 degrees S to 45 degrees N. The knowledge of environmental and genotype grouping helped reveal several patterns of genotype x environment (CE) interaction. The existence of two mega-environments - African and Asian - was indicated. Within these mega-environments, several subgroups were further discernible. The Asian-type subgroups of environments tended to be closer to one another, suggesting that they discriminated genotypes similarly. By contrast, the African-type sub-groups of environments were more divergent. Differential genotype adaptation patterns existed in the two mega-environments. The repeatability of the GE patterns seen in this multi-environmental trial, however, needs to be established over time.
引用
收藏
页码:397 / 405
页数:9
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