X-ray absorption near edge spectroscopy from reflection X-ray absorption fine structure under the grazing incidence conditions

被引：3

作者：

Tani, K

Iwata, N

Mitsueda, T

Ueha, M

Saisho, H

Iwasaki, H

机构：

[1] Ricoh Ltd, R&D Ctr, Tsuzuki Ku, Yokohama, Kanagawa 2240035, Japan

[2] Ritsumeikan Univ, SR Ctr, Kusatsu, Shiga 5258577, Japan

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 2004年 / 59卷 / 08期

关键词：

ReflXAFS; reflectivity; Kramers-Kroning relations; XANES; TiSi2; Sb-Te; thin layer;

D O I：

10.1016/j.sab.2004.03.012

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

XANES spectra, equivalent to beta-XAFS, are extracted from reflection X-ray absorption fine structure (ReflXAFS) spectra for several thin films such as TiSi2 and Sb-Te alloys, by use of the Kramers-Kroning relations recursively. The extraction is based on the interpretation that a ReflXAFS spectrum, observed as a superposition of beta-XAFS and delta-XAFS, is an extension of the Fresnel reflectivity into the energy space. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：1221 / 1225

页数：5

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