X-ray absorption near edge spectroscopy from reflection X-ray absorption fine structure under the grazing incidence conditions

被引：3
|
作者：
Tani, K
Iwata, N
Mitsueda, T
Ueha, M
Saisho, H
Iwasaki, H
机构：
[1] Ricoh Ltd, R&D Ctr, Tsuzuki Ku, Yokohama, Kanagawa 2240035, Japan
[2] Ritsumeikan Univ, SR Ctr, Kusatsu, Shiga 5258577, Japan
来源：
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 2004年 / 59卷 / 08期
关键词：
ReflXAFS; reflectivity; Kramers-Kroning relations; XANES; TiSi2; Sb-Te; thin layer;
D O I：
10.1016/j.sab.2004.03.012
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
XANES spectra, equivalent to beta-XAFS, are extracted from reflection X-ray absorption fine structure (ReflXAFS) spectra for several thin films such as TiSi2 and Sb-Te alloys, by use of the Kramers-Kroning relations recursively. The extraction is based on the interpretation that a ReflXAFS spectrum, observed as a superposition of beta-XAFS and delta-XAFS, is an extension of the Fresnel reflectivity into the energy space. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码：1221 / 1225
页数：5
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