High-Resolution Frequency-Modulation Atomic Force Microscopy in Liquids Using Electrostatic Excitation Method

被引：38

作者：

Umeda, Ken-ichi ^{[1
]}

Oyabu, Noriaki ^{[1
]}

Kobayashi, Kei ^{[2
]}

Hirata, Yoshiki ^{[3
]}

Matsushige, Kazumi ^{[1
]}

Yamada, Hirofumi ^{[1
]}

机构：

[1] Kyoto Univ, Dept Elect Sci & Engn, Nishikyo Ku, Kyoto 6158510, Japan

[2] Kyoto Univ, Innovat Collaborat Ctr, Nishikyo Ku, Kyoto 6158520, Japan

[3] Natl Inst Adv Ind Sci & Technol, Inst Biol Resources & Funct, Tsukuba, Ibaraki 3058566, Japan

来源：

APPLIED PHYSICS EXPRESS | 2010年 / 3卷 / 06期

基金：

日本科学技术振兴机构;

关键词：

CANTILEVERS; STRESS;

D O I：

10.1143/APEX.3.065205

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We developed a novel method to drive the cantilever oscillation for frequency modulation atomic force microscopy (FM-AFM) in liquid environments using electrostatic excitation. The cantilever with a gold backside coating was vibrated by applying an oscillating bias voltage between the cantilever backside and an optically transparent electrode used as a liquid cell window. The frequency spectrum of the oscillation shows a simple resonance curve without spurious peaks. The method does not require electrical conductivity of samples at all. In fact, both muscovite mica and potassium chloride surfaces in aqueous solutions were successfully imaged on an atomic scale. (C) 2010 The Japan Society of Applied Physics

引用

页数：3

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