Energy Resolution Contributions in Reach-Through Avalanche Photodiodes

被引：0
|
作者：
Gouvea, A. L. [1 ]
Fernandes, L. M. P. [1 ]
机构：
[1] Univ Coimbra, Instrumentat Ctr, P-3004516 Coimbra, Portugal
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2014年 / 61卷 / 05期
关键词：
Avalanche photodiodes; electronic noise; energy resolution; excess noise factor; gain non-uniformity; intrinsic resolution; light detection; reach-through avalanche photodiodes; X-ray detectors; X-RAY DETECTION; TEMPERATURE-DEPENDENCE; PERFORMANCE;
D O I：
10.1109/TNS.2014.2356854
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Avalanche photodiodes (APD) are used in the muonic helium Lamb shift experiment for detection of 8 keV X-rays. Reach-through APDs from Hamamatsu Photonics have been investigated for X-ray detection as alternative to conventional APDs. In order to evaluate the different contributions to the energy resolution obtained in a reach-through APD, its response to both 8 keV X-rays and visible light pulses was investigated. The intrinsic resolution was estimated by further measurements of the electronic noise contribution and the gain non-uniformity was assessed. The excess noise factor was determined. Results at different temperatures are presented.
引用
收藏
页码：2667 / 2671
页数：5
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