When Precession Electron Diffraction Tomography goes dynamical

被引：0
|
作者：
Boullay, Philippe [1 ]
Steciuk, Gwladys [1 ]
Perez, Olivier [1 ]
Petit, Sebastien [1 ]
Zaarour, Moussa [2 ]
Mintova, Svetlana [2 ]
Rickert, Karl [3 ]
Poeppelmeier, Kenneth R. [3 ]
Zhang, Wenrui [4 ]
Wang, Haiyan [4 ]
Klementova, Mariana [5 ]
Palatinus, Lukas [5 ]
机构：
[1] ENSICAEN, CNRS, UMR 6508, Lab Cristallog & Sci Mat CRISMAT, 6 Blvd Marechal Juin, F-14050 Caen, France
[2] ENSICAEN, LCS, 6 Blvd Marechal Juin, F-14050 Caen, France
[3] Northwestern Univ, Dept Chem, 2145 Sheridan Rd, Evanston, IL 60208 USA
[4] Texas A&M Univ, Dept Mat Sci & Engn, College Stn, TX 77843 USA
[5] AS CR, Inst Phys, Slovance 2, Prague, Czech Republic
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2016年 / 72卷
关键词：
dynamical refinement; incommensurate modulated structures; thin films; zeo-type materials; CRYSTAL-STRUCTURE REFINEMENT; SYSTEM;
D O I：
10.1107/S2053273316098466
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS28-O1
引用
收藏
页码：S104 / S105
页数：2
相关论文
共 50 条
  • [41] Fast electron diffraction tomography
    Gemmi, Mauro
    La Placa, Mari Grazia Immacolata
    Galanis, Athanassios
    Rauch, Edgar F.
    Nicolopoulos, Stavros
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2015, 71 : S104 - S104
  • [42] Fast electron diffraction tomography
    Gemmi, Mauro
    La Placa, Maria G. I.
    Galanis, Athanassios S.
    Rauch, Edgar F.
    Nicolopoulos, Stavros
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2015, 48 : 718 - 727
  • [43] Precession electron diffraction and its utility for structural fingerprinting in the transmission electron microscope
    Moeck, Peter
    Rouvimov, Sergei
    Nicolopoulos, Stavros
    FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009, 2009, 1173 : 299 - +
  • [44] Precession electron diffraction and its utility for structural fingerprinting in the transmission electron microscope
    Moeck, Peter
    Rouvimov, Sergei
    Nicolopoulos, Stavros
    NANOTECH CONFERENCE & EXPO 2009, VOL 1, TECHNICAL PROCEEDINGS: NANOTECHNOLOGY 2009: FABRICATION, PARTICLES, CHARACTERIZATION, MEMS, ELECTRONICS AND PHOTONICS, 2009, : 417 - +
  • [45] Structure determination of intermetallics using Precession Electron Diffraction.
    Meshi, Louisa
    Samuha, Shmuel
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2012, 68 : S99 - S99
  • [46] Rietveld analysis of policrystalline materials using precession of electron diffraction
    Prodan, G.
    Ciupina, V.
    ROMANIAN BIOTECHNOLOGICAL LETTERS, 2010, 15 (03): : 102 - 108
  • [47] Crystallographic variant mapping using precession electron diffraction data
    Hansen, Marcus H.
    Wang, Ainiu L.
    Dong, Jiaqi
    Zhang, Yuwei
    Umale, Tejas
    Banerjee, Sarbajit
    Shamberger, Patrick
    Pharr, Matt
    Karaman, Ibrahim
    Xie, Kelvin Y.
    MICROSTRUCTURES, 2023, 3 (04):
  • [48] Precession diffraction for reliable electron pair distribution function analysis
    Das, Partha Pratim
    Nicolopoulos, Stavros
    Gemmi, Mauro
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2017, 73 : C983 - C983
  • [49] Is precession electron diffraction kinematical? Part II A practical method to determine the optimum precession angle
    Eggeman, A. S.
    White, T. A.
    Midgley, P. A.
    ULTRAMICROSCOPY, 2010, 110 (07) : 771 - 777
  • [50] Precession electron diffraction and its advantages for structural fingerprinting in the transmission electron microscope
    Moeck, Peter
    Rouvimov, Sergei
    ZEITSCHRIFT FUR KRISTALLOGRAPHIE-CRYSTALLINE MATERIALS, 2010, 225 (2-3): : 110 - 124
12345