Complex transients of input power and electron density in pulsed inductively coupled discharges

被引:13
|
作者
Gao, Fei [1 ]
Lv, Xiang-Yun [1 ]
Zhang, Yu-Ru [1 ]
Wang, You-Nian [1 ]
机构
[1] Dalian Univ Technol, Sch Phys, Minist Educ, Key Lab Mat Modificat Laser Ion & Electron Beams, Dalian 116024, Peoples R China
基金
中国国家自然科学基金;
关键词
MODULATED HIGH-DENSITY; HAIRPIN RESONATOR; PLASMAS; UNIFORMITY; EVOLUTION; ARGON;
D O I
10.1063/1.5114661
中图分类号
O59 [应用物理学];
学科分类号
摘要
Time-dependent studies of pulsed inductively coupled Ar and Ar/CF4 discharges are presented in this work. By using a time-resolved power diagnosis system, i.e., a Langmuir probe and a Hairpin probe, the temporal evolutions of input power and electron density are measured. In the initial pulse stage, the input power exhibits two peaks, which are related to the properties of the source and the plasma, respectively. In addition, an overshoot of the electron density is observed in the initial pulse stage at high powers (500-800W) and low pressures (1-10mTorr), and the overshoot becomes weaker by increasing pressure (10-80mTorr) or decreasing input power (200-500W). This can be explained by the dependence of the power transfer efficiency on pressure and input power, as well as the balance between the electron production and loss rates. When the power is turned off, the electron density and the input power exhibit a peak at the initial afterglow period, due to the release of charges from capacitors and inductors in the radio frequency power source. In Ar/CF4 discharges, the plasma responds to the changes in the input power more quickly than in Ar discharges, so it takes a shorter time to reach the ionization equilibrium. This may be caused by more ionization channels, larger ionization cross section, and lower ionization thresholds in Ar/CF4 plasmas.
引用
收藏
页数:8
相关论文
共 50 条
  • [41] Harmonic content and time variation of electron energy distributions in high-plasma-density, low-pressure inductively coupled discharges
    Vasenkov, AV
    Kushner, MJ
    JOURNAL OF APPLIED PHYSICS, 2003, 94 (04) : 2223 - 2233
  • [43] Power Matching to Pulsed Inductively Coupled Plasmas (vol 127, 133302, 2020)
    Qu, Chenhui
    Lanham, Steven J.
    Shannon, Steven C.
    Nam, Sang Ki
    Kushner, Mark J.
    JOURNAL OF APPLIED PHYSICS, 2020, 128 (08)
  • [44] RESPONSE OF THE ELECTRON-DENSITY AND TEMPERATURE TO THE POWER INTERRUPTION MEASURED BY THOMSON SCATTERING IN AN INDUCTIVELY-COUPLED PLASMA
    DEREGT, JM
    VANDERMULLEN, JAM
    SCHRAM, DC
    PHYSICAL REVIEW E, 1995, 52 (03): : 2982 - 2987
  • [45] Anomalous behaviour of the electron density in a pulsed complex plasma
    Berndt, J
    Kovacevic, E
    Selenin, V
    Stefanovic, I
    Winter, J
    PLASMA SOURCES SCIENCE & TECHNOLOGY, 2006, 15 (01): : 18 - 22
  • [46] Mining effect of inert gas mixing on electron energy distribution function in inductively coupled discharges
    Pu, YK
    Guo, ZG
    Aman-ur-Rehman
    Yu, ZD
    Ma, J
    PLASMA PHYSICS AND CONTROLLED FUSION, 2006, 48 (01) : 61 - 70
  • [47] Nonlocal collisionless power absorption using effective viscosity model in inductively coupled plasma discharges
    Rehman, Aman
    Lee, J. K.
    PHYSICS OF PLASMAS, 2009, 16 (07)
  • [48] Temporal evolution of two-dimensional electron temperature and ion flux on a substrate in a pulsed-power inductively coupled plasma
    Park, Il-seo
    Kim, Dong-Hwan
    Kim, Kyung-Hyun
    Chung, Chin-Wook
    PHYSICS OF PLASMAS, 2017, 24 (05)
  • [49] Electron Density and Electron Temperature Control with a Magnetic Field and a Grid in Inductively Coupled Argon Plasma
    Yun-peng He
    Wei Jin
    Yi-bo Wang
    Shao-bo Lv
    Rui-sheng Wang
    Jun-qi Liu
    Hai-cheng Liu
    Plasma Chemistry and Plasma Processing, 2023, 43 : 381 - 400
  • [50] Electron Density and Electron Temperature Control with a Magnetic Field and a Grid in Inductively Coupled Argon Plasma
    He, Yun-peng
    Jin, Wei
    Wang, Yi-bo
    Lv, Shao-bo
    Wang, Rui-sheng
    Liu, Jun-qi
    Liu, Hai-cheng
    PLASMA CHEMISTRY AND PLASMA PROCESSING, 2023, 43 (01) : 381 - 400