Data-Driven Modeling of Low Frequency Noise Using Capture-Emission Energy Maps

被引:0
|
作者
Lee, Jonghwan [1 ]
机构
[1] Sangmyung Univ, Dept Syst Semicond Engn, Cheonan 31066, South Korea
来源
APPLIED SCIENCES-BASEL | 2021年 / 11卷 / 01期
基金
新加坡国家研究基金会;
关键词
low frequency noise; negative bias temperature instability; capture-emission energy map; gaussian mixture model; 1/F NOISE; NBTI; DEGRADATION; SIMULATION; COMPONENT; RECOVERY;
D O I
10.3390/app11010356
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
A new approach for modeling low frequency noise is presented to enable the predictions of noise behavior from negative bias temperature instability (NBTI). The noise model is based on a capture-emission energy (CEE) map describing the probability density function of widely distributed defect capture-emission activation energies. To enlarge the capture-emission energy window and to perform the accurate estimation of the recoverable component of CEE, the Gaussian mixture model (GMM) is applied to the CEE map. This approach provides an efficient identification of noise sources and an in-depth noise analysis under both stationary and cyclo-stationary conditions.
引用
收藏
页码:1 / 8
页数:8
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