Hard X-ray diffraction scanning tomography with sub-micrometer spatial resolution

被引：0
|
作者：
Palancher, Herve [1 ]
Tucoulou, Remi [2 ]
Bleuet, Pierre [3 ]
Welcomme, Eleonore [1 ]
Bonnin, Anne [1 ,2 ]
Cloetens, Peter [2 ]
机构：
[1] CEA, DEN, DEC, F-13108 St Paul Les Durance, France
[2] ESRF, ID22 ID22Ni, F-38043 Grenoble, France
[3] CEA, LETI, MINATEC, F-38054 Grenoble, France
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2010年 / 66卷
关键词：
diffraction tomography; 3D-characterization; sub-micrometer resolution;
D O I：
10.1107/S0108767310097862
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
FA5-MS40-T
引用
收藏
页码：S100 / S100
页数：1
相关论文
共 50 条
  • [21] Soft X-Ray Lithography for High-Aspect Ratio Sub-Micrometer Structures
    Goettert, J.
    Lemke, S.
    Rudolph, I.
    Seliger, T.
    Loechel, B.
    NANOTECHNOLOGY 2012, VOL 2: ELECTRONICS, DEVICES, FABRICATION, MEMS, FLUIDICS AND COMPUTATIONAL, 2012, : 188 - 191
  • [22] Recent developments in X-ray imaging with micrometer spatial resolution
    Martin, T
    Koch, A
    JOURNAL OF SYNCHROTRON RADIATION, 2006, 13 : 180 - 194
  • [23] Fabrication of two-dimensional photonic structure of titanium dioxide with sub-micrometer resolution by deep x-ray lithography
    Awazu, K
    Fujimaki, M
    Wang, XM
    Sai, A
    Ohki, Y
    NANOENGINEERED ASSEMBLIES AND ADVANCED MICRO/NANOSYSTEMS, 2004, 820 : 295 - 300
  • [24] Magnified hard x-ray microtomography:: Toward tomography with sub-micron resolution
    Schroer, CG
    Benner, B
    Günzler, TF
    Kuhlmann, M
    Lengeler, B
    Rau, C
    Weitkamp, T
    Snigirev, A
    Snigireva, I
    DEVELOPMENTS IN X-RAY TOMOGRAPHY III, 2002, 4503 : 23 - 33
  • [25] On-chip planar hydrogen sensor with sub-micrometer spatial resolution
    Herbertz, S.
    Cerchez, M.
    Heinzel, T.
    SENSORS AND ACTUATORS B-CHEMICAL, 2015, 221 : 401 - 405
  • [26] Imaging of thermal conductivity with sub-micrometer resolution using scanning thermal microscopy
    Gu, YQ
    Ruan, XL
    Han, L
    Zhu, DZ
    Sun, XY
    INTERNATIONAL JOURNAL OF THERMOPHYSICS, 2002, 23 (04) : 1115 - 1124
  • [27] Imaging of Thermal Conductivity with Sub-Micrometer Resolution Using Scanning Thermal Microscopy
    Y. Q. Gu
    X. L. Ruan
    L. Han
    D. Z. Zhu
    X. Y. Sun
    International Journal of Thermophysics, 2002, 23 : 1115 - 1124
  • [28] Hard X-Ray Scanning Microscopy with Coherent Diffraction Contrast
    Schroer, C. G.
    Schropp, A.
    Boye, P.
    Hoppe, R.
    Patommel, J.
    Hoenig, S.
    Samberg, D.
    Stephan, S.
    Schoeder, S.
    Burghammer, M.
    Wellenreuther, G.
    Falkenberg, G.
    10TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY, 2011, 1365 : 227 - 230
  • [29] Hard X-Ray Scanning Microscopy with Fluorescence and Diffraction Contrast
    Schroer, Christian G.
    Boye, Pit
    Feldkamp, Jan M.
    Patommel, Jens
    Schropp, Andreas
    Schwab, Andreas
    Stephan, Sandra
    Burghammer, Manfred
    Schoeder, Sebastian
    Riekel, Christian
    Schroeder, Walter H.
    9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY, 2009, 186
  • [30] Optimizing contrast and spatial resolution in hard x-ray tomography of medically relevant tissues
    Rodgers, Griffin
    Schulz, Georg
    Deyhle, Hans
    Kuo, Willy
    Rau, Christoph
    Weitkamp, Timm
    Mueller, Bert
    APPLIED PHYSICS LETTERS, 2020, 116 (02)
12345