Random error estimation in refractive index measured with the terahertz time domain spectroscopy

被引:10
|
作者
Tripathi, Saroj R. [1 ]
Aoki, Makoto [1 ]
Mochizuki, Kento [1 ]
Asahi, Toshiaki [2 ]
Hosako, Iwao [3 ]
Hiromoto, Norihisa [1 ]
机构
[1] Shizuoka Univ, Grad Sch Sci & Technol, Hamamatsu, Shizuoka 4328011, Japan
[2] Nippon Min & Met Co Ltd, Toda, Saitama 3358502, Japan
[3] Natl Inst Informat & Commun Technol, Koganei, Tokyo 1848795, Japan
来源
IEICE ELECTRONICS EXPRESS | 2009年 / 6卷 / 23期
关键词
THz-TDS; optical constants; refractive index; random errors;
D O I
10.1587/elex.6.1690
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This study proposes a practical method to estimate the random error in real part of refractive index measured with terahertz time domain spectroscopy (THz-TDS) for the single measurement of sample by using the phase spectra of the reference terahertz electric field and their standard deviation. The validity of this method is based on the experimental result that the phase correlates with its standard deviation and the signal to noise ratio is almost equal in the phase spectra of reference and sample signal. The random error estimated from the proposed method fitted well to the statistically computed standard deviation.
引用
收藏
页码:1690 / 1696
页数:7
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