Room-temperature epitaxial growth of indium tin oxide thin films on Si substrates with an epitaxial CeO2 ultrathin buffer

被引:41
|
作者
Tashiro, J [1 ]
Sasaki, A [1 ]
Akiba, S [1 ]
Satoh, S [1 ]
Watanabe, T [1 ]
Funakubo, H [1 ]
Yoshimoto, M [1 ]
机构
[1] Tokyo Inst Technol, Dept Innovat & Engineered Mat, Yokohama, Kanagawa 2268502, Japan
关键词
epitaxy; indium tin oxide; laser ablation; solar cells;
D O I
10.1016/S0040-6090(02)00623-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Room-temperature epitaxy of indium tin oxide (ITO) thin films was achieved on Si(I 11) substrates with an epitaxial CeO2 ultrathin buffer using a pulsed laser deposition technique. The epitaxial CeO, buffer layer was also grown at room temperature. Reflection high-energy electron diffraction and pole figure X-ray diffraction analyses confirmed the formation of a double heteroepitaxial structure of ITO(111)/CeO2(111)/Si(111) with the epitaxial relationship Of [-110](110)//[-110](CeO2H)//[1-10](Si). The junction of [ITO: 100 nm thick/CeO2: 3 nm thick/p-Si(111)] fabricated at room temperature exhibited solar cell properties. (C) 2002 Elsevier Science B.V All rights reserved.
引用
收藏
页码:272 / 275
页数:4
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