Optical mixing with difference frequencies to 552 GHz in ultrafast high electron mobility transistors

被引:15
|
作者
Ali, ME [1 ]
Ramesh, KS
Fetterman, HR
Matloubian, M
Boll, G
机构
[1] Univ Calif Los Angeles, Dept Elect Engn, Los Angeles, CA 90095 USA
[2] Hughes Res Labs, Malibu, CA 90265 USA
[3] GGB Ind Inc, Naples, FL 34101 USA
关键词
high electron mobility transistors (HEMT's); millimeter-wave generation; optical heterodyning; optical mixing; photodetectors; phototransistors; terahertz frequencies;
D O I
10.1109/68.853534
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The technology of optical mixing in three-terminal devices has been extended, for the first time, to submillimeter-wave frequencies, Using a new generation of 50-nm gate InP-based high electron mobility transistors (HEMT's), optically mixed signals were detected to 552 GHz with a signal-to-noise ratio of approximately 5 dB, A novel harmonic three-wave mixing scheme was used for the detection of the optically generated signals. The technique involved downconversion of the signal in the device by the second harmonic of a gate-injected millimeter-wave local oscillator. Measurements were also done at 212 and 382 GHz to estimate the absolute signal strength and conversion losses. Finally, new interesting features in the bias dependence of the optically mixed signal are reported.
引用
收藏
页码:879 / 881
页数:3
相关论文
共 50 条
  • [41] Fabrication of AlGaN/GaN high electron mobility transistors
    Wu, T
    Hao, ZB
    Guo, WP
    Wu, SW
    Luo, Y
    Zeng, QM
    Li, XJ
    APOC 2002: ASIA-PACIFIC OPTICAL AND WIRELESS COMMUNICATIONS; MATERIALS AND DEVICES FOR OPTICAL AND WIRELESS COMMUNICATIONS, 2002, 4905 : 335 - 337
  • [42] Photoreflectance study of pseudomorphic high electron mobility transistors
    Han, AC
    Wojtowicz, M
    Pascua, D
    Block, TR
    Streit, DC
    JOURNAL OF APPLIED PHYSICS, 1997, 82 (05) : 2607 - 2610
  • [43] Model the AlGaN/GaN High Electron Mobility Transistors
    Wang, Yan
    Cheng, Xiaoxu
    Li, Xiaojian
    NANOTECHNOLOGY 2012, VOL 2: ELECTRONICS, DEVICES, FABRICATION, MEMS, FLUIDICS AND COMPUTATIONAL, 2012, : 738 - 743
  • [44] THERMAL NOISE IN HIGH ELECTRON-MOBILITY TRANSISTORS
    VANDERZIEL, A
    WU, EN
    SOLID-STATE ELECTRONICS, 1983, 26 (05) : 383 - 384
  • [45] Nanowire radial heterostructures as high electron mobility transistors
    Li, Yat
    Xiang, Jie
    Qian, Fang
    Gradecak, Silvija
    Wu, Yue
    Yan, Hao
    Lieber, Charles M.
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2006, 231
  • [46] HIGH ELECTRON-MOBILITY TRANSISTORS (HEMTS) - A REVIEW
    HILL, AJ
    LADBROOKE, PH
    GEC JOURNAL OF RESEARCH, 1986, 4 (01): : 1 - 14
  • [47] AN ANALYTICAL MODEL FOR HIGH-ELECTRON-MOBILITY TRANSISTORS
    AHN, H
    ELNOKALI, M
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1994, 41 (06) : 874 - 878
  • [48] High electron mobility transistors fabricated by nanoimprint lithography
    Chen, Y
    Macintyre, DS
    Boyd, E
    Moran, D
    Thayne, I
    Thoms, S
    MICROELECTRONIC ENGINEERING, 2003, 67-8 : 189 - 195
  • [49] Nonequilibrium transport in scaled high electron mobility transistors
    Kalna, K
    Asenov, A
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2002, 17 (06) : 579 - 584
  • [50] SCALING PROPERTIES OF HIGH ELECTRON-MOBILITY TRANSISTORS
    KIZILYALLI, IC
    HESS, K
    LARSON, JL
    WIDIGER, DJ
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1986, 33 (10) : 1427 - 1433