共 50 条
- [41] Overview of 3D Micro- and Nanocoordinate Metrology at PTB [J]. APPLIED SCIENCES-BASEL, 2016, 6 (09):
- [42] CMS to Offer New Portable 3D Metrology Certification [J]. MANUFACTURING ENGINEERING, 2014, 152 (04): : 12 - 12
- [43] Advanced overlay metrology for 3D NAND bonding applications [J]. METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVII, 2023, 12496
- [44] Can We Get 3D CD Metrology Right? [J]. METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXVI, PTS 1 AND 2, 2012, 8324
- [46] Recognition of 3D Package Shapes for Single Camera Metrology [J]. 2014 IEEE WINTER CONFERENCE ON APPLICATIONS OF COMPUTER VISION (WACV), 2014, : 99 - 106
- [47] Hybrid Metrology for 3D Architectures Using Machine Learning [J]. METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVIII, 2024, 12955
- [48] Special Section Guest Editorial: 3D Semiconductor Metrology [J]. JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3, 2023, 22 (03):
- [49] 3D genome reconstruction from chromosomal contacts [J]. NATURE METHODS, 2014, 11 (11) : 1141 - 1143
- [50] 3D metrology solution for the 65nm node [J]. 24TH ANNUAL BACUS SYMPOSIUM ON PHOTOMASK TECHNOLOGY, PT 1 AND 2, 2004, 5567 : 905 - 910