Artificial Intelligence in Industrial Systems

被引：19
|
作者：
Palhares, R. M. [1 ]
Yuan, Y. [2 ]
Wang, Q. [2 ]
机构：
[1] Univ Fed Minas Gerais, BR-31270901 Belo Horizonte, MG, Brazil
[2] Northwestern Polytech Univ, Xian 710072, Shaanxi, Peoples R China
来源：
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS | 2019年 / 66卷 / 12期
关键词：
DATA-DRIVEN; FAULT-DIAGNOSIS; OPTIMIZATION; FRAMEWORK; NETWORK;
D O I：
10.1109/TIE.2019.2916709
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
[No abstract available]
引用
收藏
页码：9636 / 9640
页数：5
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