A vertical-cavity surface-emitting laser at threshold

被引：10
|
作者：
Fordell, Thomas [1 ]
Toffano, Zeno
Lindberg, Asa Marie
机构：
[1] Univ Helsinki, Dept Phys Sci, FIN-00014 Helsinki, Finland
[2] Supelec, Dept Telecommun, Ecole Super Elect, F-91192 Gif Sur Yvette, France
来源：
IEEE PHOTONICS TECHNOLOGY LETTERS | 2006年 / 18卷 / 21-24期
基金：
芬兰科学院;
关键词：
optical spectroscopy; quantum-well lasers; semiconductor lasers;
D O I：
10.1109/LPT.2006.884882
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Linewidth is measured over the threshold transition of a vertical-cavity surface-emitting laser and results are compared to a Fokker-Planck semiconductor laser model. The linewidth shows nonmonotonous behavior at threshold similar to that previously observed in distributed feedback lasers. The behavior agrees with the Fokker-Planck model if the linewidth enhancement factor alpha approximate to .5.0. Measurement of the relaxation oscillation frequency and the damping rate using an injected optical probe allows, together with the Fokker-Planck model, the extraction of major laser parameters.
引用
收藏
页码：2263 / 2265
页数：3
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