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- [14] A novel optical tweezers system - art. no. 68343M OPTICAL DESIGN AND TESTING III, PTS 1 AND 2, 2008, 6834 : M8343 - M8343
- [16] Measuring Β → ρπ decays and the unitarity angle α -: art. no. 036001 PHYSICAL REVIEW D, 2000, 62 (03):
- [17] Optical measuring system for defects of artillery lumen - art. no. 66240G INTERNATIONAL SYMPOSIUM ON PHOTOELECTRONIC DETECTION AND IMAGING 2007: OPTOELECTRONIC SYSTEM DESIGN, MANUFACTURING, AND TESTING, 2008, 6624 : G6240 - G6240
- [18] A novel microscanning device - art. no. 683614 MEMS/MOEMS TECHNOLOGIES AND APPLICATIONS III, 2008, 6836 : 83614 - 83614
- [19] A novel ellipsometer for measuring thickness of oxide layer on the surface of silicon sphere - art. no. 683443 OPTICAL DESIGN AND TESTING III, PTS 1 AND 2, 2008, 6834 : 83443 - 83443