Characterization of a microfocused circularly polarized x-ray probe

被引：12
|
作者：
Pollmann, J [1 ]
Srajer, G
Maser, J
Lang, JC
Nelson, CS
Venkataraman, CT
Isaacs, ED
机构：
[1] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA
[2] Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2000年 / 71卷 / 06期
关键词：
D O I：
10.1063/1.1150625
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We report on the development of a circularly polarized x-ray microprobe in the intermediate energy range from 5 to 10 keV. In this experiment linearly polarized synchrotron radiation was circularly polarized by means of a Bragg-diffracting diamond phase retarder and subsequently focused down to a spot size of about 4 x 2 mu m(2) by a Fresnel zone plate. The properties of the microprobe were characterized, and the technique was applied to the two-dimensional mapping of magnetic domains in HoFe2. (C) 2000 American Institute of Physics. [S0034-6748(00)01206-5].
引用
收藏
页码：2386 / 2390
页数：5
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