A Comprehensive and Accurate Analytical SPAD Model for Circuit Simulation

被引:42
|
作者
Cheng, Zeng [1 ]
Zheng, Xiaoqing [1 ]
Palubiak, Darek [1 ]
Deen, M. Jamal [2 ]
Peng, Hao [3 ]
机构
[1] McMaster Univ, Dept Elect & Comp Engn, Hamilton, ON L8S 4K1, Canada
[2] McMaster Univ, Dept Elect & Comp Engn, Sch Biomed Engn, Hamilton, ON L8S 4K1, Canada
[3] McMaster Univ, Dept Med Phys, Hamilton, ON L8S 4K1, Canada
基金
加拿大自然科学与工程研究理事会; 加拿大创新基金会;
关键词
Cadence Spectre; circuit model; single-photon avalanche diode (SPAD); Synopsys HSPICE; Verilog-A hardware description language (HDL); AVALANCHE PHOTODIODES; GEIGER MODE; RESOLUTION; DIODES;
D O I
10.1109/TED.2016.2537879
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The single-photon avalanche diode (SPAD) is an attractive photosensor due to its high sensitivity and low dead time. In this paper, a comprehensive, accurate analytical SPAD circuit simulation model is proposed and implemented in Verilog-A hardware description language. It shows great application universality and is fully compatible with mainstream commercial circuit simulators. This model incorporates all important operating features of the SPAD. Most importantly, to the best of our knowledge, it is the first time that the band-to-band tunneling mechanism and the temporal dependence of after-pulsing probability are included in an SPAD circuit simulation model. The parameter extraction processes from interavalanche time measurement of a free-running SPAD device are discussed. The simulation results indicate that the proposed model works well. In addition, the primary dark counts from the model are validated against the measurement results. A maximum relative error of 8.7% is observed at 20 degrees C with an excess voltage of 0.5 V. The accuracy of this paper can be greatly improved by using more accurate physical parameters available from the SPAD fabrication vendor.
引用
收藏
页码:1940 / 1948
页数:9
相关论文
共 50 条
  • [41] Adaption of Triple Gate Junctionless MOSFETs Analytical Compact Model for Accurate Circuit Design in a Wide Temperature Range
    Cerdeira, Antonio
    Avila-Herrera, Fernando
    Estrada, Magali
    Doria, Rodrigo T.
    Pavanello, Marcelo A.
    [J]. 2018 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS), 2018, : 97 - 100
  • [42] An improved model of Robinson equivalent circuit analytical model
    Mao XiangYu
    Du PingAn
    [J]. SCIENCE CHINA-TECHNOLOGICAL SCIENCES, 2010, 53 (07) : 1993 - 1999
  • [43] An improved model of Robinson equivalent circuit analytical model
    MAO XiangYu & DU PingAn School of Mechatronics Engineering
    [J]. Science China Technological Sciences, 2010, (07) : 1993 - 1999
  • [44] An improved model of Robinson equivalent circuit analytical model
    MAO XiangYu DU PingAn School of Mechatronics Engineering University of Electronic Science and Technology of China Chengdu China
    [J]. Science China(Technological Sciences)., 2010, 53 (07) - 1999
  • [45] An improved model of Robinson equivalent circuit analytical model
    XiangYu Mao
    Ping An Du
    [J]. Science China Technological Sciences, 2010, 53 : 1993 - 1999
  • [46] An Analytical Model of Single-Event Transients in Double-Gate MOSFET for Circuit Simulation
    Aneesh, Y. M.
    Sriram, S. R.
    Pasupathy, K. R.
    Bindu, B.
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2019, 66 (09) : 3710 - 3717
  • [47] S-TFT: An analytical model of polysilicon thin-film transistors for circuit simulation
    Yang, GY
    Kim, YG
    Kim, TS
    Kong, JT
    [J]. PROCEEDINGS OF THE IEEE 2000 CUSTOM INTEGRATED CIRCUITS CONFERENCE, 2000, : 213 - 216
  • [48] Accurate Fringe Capacitance Model Considering RSD and Metal Contact for Realistic FinFETs and Circuit Performance Simulation
    Choe, Kyeungkeun
    An, TaeYoon
    Kim, SoYoung
    [J]. 2014 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES (SISPAD), 2014, : 29 - 32
  • [49] An accurate analytical crosstalk model for RC interconnect
    Sekhar, P. Chandra
    Rao, Rameshwar
    [J]. PROCEEDINGS OF THE 2ND WSEAS INTERNATIONAL CONFERENCE ON CIRCUITS, SYSTEMS, SIGNALS AND TELECOMMUNICATIONS (CISST '08): CIRCUITS, SYSTEMS, SIGNAL & COMMUNICATIONS, 2008, : 29 - 35
  • [50] Interconnect thermal modeling for accurate simulation of circuit timing and reliability
    Chen, DQ
    Li, EH
    Rosenbaum, E
    Kang, SM
    [J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2000, 19 (02) : 197 - 205