Analytical Model of Correlation Factor for Human-Body Model to Transmission-Line Pulse ESD Testing

被引：9
|
作者：
Lee, Jian-Hsing [1 ,2 ]
Iyer, Natarajan Mahadeva [3 ]
机构：
[1] GLOBAL FOUNDRIES Inc, ESD, Malta, NY 12020 USA
[2] GLOBAL FOUNDRIES Inc, Latchup Dept, Malta, NY 12020 USA
[3] GLOBAL FOUNDRIES Inc, Reliabil Engn Dept, Malta, NY 12020 USA
来源：
IEEE ELECTRON DEVICE LETTERS | 2017年 / 38卷 / 07期
关键词：
Transmission-line pulse (TLP); electrostatic-discharge (ESD); human-body model (HBM);
D O I：
10.1109/LED.2017.2708420
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Physics of correlation between standard ESD testing and transmission line pulse test results on semiconductor devices using a simple resistor (R) inductor (L) capacitor (C) circuit model approach is presented. The correlation is not a constant factor, however, it can be used to evaluate the time to failure for the device during the human-body model event and is attributed to the time to induce the thermal runaway of the device during the electrostatic-discharge event.
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页码：952 / 954
页数：3
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