Analytical Model of Correlation Factor for Human-Body Model to Transmission-Line Pulse ESD Testing

被引：9

作者：

Lee, Jian-Hsing ^{[1
,2
]}

Iyer, Natarajan Mahadeva ^{[3
]}

机构：

[1] GLOBAL FOUNDRIES Inc, ESD, Malta, NY 12020 USA

[2] GLOBAL FOUNDRIES Inc, Latchup Dept, Malta, NY 12020 USA

[3] GLOBAL FOUNDRIES Inc, Reliabil Engn Dept, Malta, NY 12020 USA

来源：

IEEE ELECTRON DEVICE LETTERS | 2017年 / 38卷 / 07期

关键词：

Transmission-line pulse (TLP); electrostatic-discharge (ESD); human-body model (HBM);

D O I：

10.1109/LED.2017.2708420

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Physics of correlation between standard ESD testing and transmission line pulse test results on semiconductor devices using a simple resistor (R) inductor (L) capacitor (C) circuit model approach is presented. The correlation is not a constant factor, however, it can be used to evaluate the time to failure for the device during the human-body model event and is attributed to the time to induce the thermal runaway of the device during the electrostatic-discharge event.

引用

页码：952 / 954

页数：3

共 50 条

[1] Physical Model for ESD Human Body Model to Transmission Line Pulse
Lee, Jian-Hsing
Iyer, Natarajan Mahadeva
Maloney, Timothy J.
2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2019,
[2] Transmission-line pulse ESD testing of ICs: A new beginning
Henry, L.G. (leogesd@pacbell.net), 2001, Geological Society of Norway (18):
[3] Does the ESD-failure current obtained by transmission-line pulsing always correlate to human body model tests?
Stadler, W
Guggenmos, X
Egger, P
Gieser, H
Musshoff, C
MICROELECTRONICS RELIABILITY, 1998, 38 (11) : 1773 - 1780
[4] Does the ESD-failure current obtained by Transmission-Line Pulsing always correlate to Human Body Model tests?
Stadler, W
Guggenmos, X
Egger, P
Gieser, H
Musshoff, C
ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM PROCEEDINGS 1997, 1997, : 366 - 372
[5] TRANSMISSION-LINE MODEL
BENEDICT, AG
IEEE SPECTRUM, 1970, 7 (04) : 6 - &
[6] Electrostatic Test Structures for Transmission Line Pulse and Human Body Model Testing at Wafer Level
Ashton, Robert
Fairbanks, Stephen
Bergen, Adam
Grund, Evan
PROCEEDINGS OF THE 2018 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS), 2018, : 48 - 53
[7] Correlation of Human Metal Model and Transmission Line Pulsing Testing
Malobabic, Slavica
Salcedo, Javier A.
Righter, Alan W.
Hajjar, Jean-Jacques
Liou, Juin J.
IEEE ELECTRON DEVICE LETTERS, 2011, 32 (09) : 1200 - 1202
[8] AN ANALYTICAL MODEL FOR ALLOYED OHMIC CONTACTS USING A TRILAYER TRANSMISSION-LINE MODEL
REEVES, GK
HARRISON, HB
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1995, 42 (08) : 1536 - 1547
[9] A TRANSMISSION-LINE WOOFER MODEL
BULLOCK, RM
HILLMAN, PE
JOURNAL OF THE AUDIO ENGINEERING SOCIETY, 1986, 34 (12): : 1033 - 1033
[10] TRANSMISSION-LINE MODEL OF THE HUMAN PULMONARY ARTERIAL BED
MCILROY, MB
TARGETT, RC
FEDERATION PROCEEDINGS, 1987, 46 (04) : 1112 - 1112

← 1 2 3 4 5 →