Radiation tolerance of high-density FPGAs

SRAM-based high-density FPGAs offer many advantages in satellite and other aerospace applications; which raises the question of the susceptibility of configuration latches to radiation-induced upsets. Radiation testing has established that specially processed Xilinx devices exhibit latch-up immunity and a very low probability of soft errors in their configuration-storage latches and user flip-flops. The devices, designs and results are described, including triple-redundant systems that can quickly detect and repair a soft error.