Reliability analysis of discrete event dynamic systems with Petri nets

被引:55
|
作者
Sadou, Nabil [1 ]
Demmou, Hamid [2 ,3 ]
机构
[1] Supelec IETR, F-35511 Cesson Sevigne, France
[2] CNRS, LAAS, F-31077 Toulouse, France
[3] Univ Toulouse, UPS, INSA, ISAE,LAAS,INP, F-31077 Toulouse, France
关键词
Embedded systems; Reliability analysis; Petri net; Linear logic; Feared scenarios; Minimality;
D O I
10.1016/j.ress.2009.06.006
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper deals with dynamic reliability of embedded systems. It presents a method for deriving feared scenarios (which might lead the system to a critical situation) in Petri nets. A classical way to obtain scenarios in Petri nets is to generate the reachability graph. However, for complex systems, it leads to the state space explosion. To avoid this problem, in our approach. Petri net reachability is translated into provability of linear logic sequents. Linear logic bases are introduced and used to formally define scenarios and minimality of scenarios. These definitions allow the method to produce only pertinent scenarios. The steps of the method are described and illustrated through a landing-gear system example. (C) 2009 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1848 / 1861
页数:14
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