GaAs(001) (2 x 4) to c(4 x 4) transformation observed in situ by STM during As flux irradiation

被引:5
|
作者
Bastiman, F. [1 ]
Cullis, A. G. [1 ]
Hopkinson, M. [1 ]
机构
[1] Univ Sheffield, Dept Elect & Elect Engn, Sheffield S1 3JD, S Yorkshire, England
关键词
Scanning tunnelling microscopy; Molecular beam epitaxy; (2 x 4); c(4 x 4); In vivo; Concurrent; MOLECULAR-BEAM EPITAXY; SCANNING-TUNNELING-MICROSCOPY; MBE GROWTH; SURFACE; RECONSTRUCTION; GA; NUCLEATION; DIFFUSION;
D O I
10.1016/j.susc.2009.05.015
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Atomic resolution scanning tunnelling microscopy (STM) has been used to study in situ the As-terminated ;reconstructions formed on GaAs(0 0 1) surfaces in the presence of an AS(4) flux. The relationship between the As-rich (2 x 4) and c(4 x 4) surfaces is observed throughout the gradual evolution of the reconstruction transformation. The results suggest that during the initial stage of the transformation, Ga-rich As-terminated variations of the c(4 x 4) form in order to accommodate excess mobile Ga produced by pit formation. These transient structures later planarize, as excess Ga is incorporated at step/island edges. Successive imaging of the same sample area during As-4 irradiation allows point-by-point adatom binding to be analysed in a way inaccessible to MBE-STM systems relying on sample quenching and transfer. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:2398 / 2402
页数:5
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