3-Layer Stacked Voltage-Domain Global Shutter CMOS Image Sensor with 1.8μm-Pixel-Pitch

被引:2
|
作者
Kim, Seung-Sik [1 ]
Lee, Gwi-Deok Ryan [1 ]
Park, Sang-Su [1 ]
Shim, Heesung [1 ]
Kim, Dae-Hoon [1 ]
Choi, Minjun [1 ]
Kim, Sangyoon [1 ]
Park, Gyunha [1 ]
Oh, Seung-Jae [1 ]
Moon, Joosung [1 ]
Park, Sungbong [1 ]
Yoon, Sol [1 ]
Jeong, Jihye [1 ]
Park, Sejin [1 ]
Lee, Sanggwon [1 ]
Lee, HaeJung [1 ]
Ryu, Wonoh [1 ]
Kim, Taehyoung [1 ]
Kwon, Doowon [1 ]
Choi, Hyuk Soon [1 ]
Kim, Hongki [1 ]
Go, Jonghyun [1 ]
Kim, JinGyun [1 ]
Lim, Seunghyun [1 ]
Na, HoonJoo [1 ]
Lee, Jae-Kyu [1 ]
Moon, Chang-Rok [1 ]
Song, Jaihyuk [1 ]
机构
[1] Samsung Elect, Hwaseong, South Korea
关键词
D O I
10.1109/IEDM45625.2022.10019515
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A voltage-domain global shutter image sensor with 1.8 mu m-pixel-pitch was fabricated based on a 3-layer stacking scheme enabled by pixel-level Cu-to-Cu bonding processes. Excellent sensor performances i.e. ultra-low parasitic light sensitivity less than -130dB, 1.8e-rms of temporal noise, and 14ke- of full-well capacity were achieved, thanks to high-capacity DRAM capacitors, dual vertical-channel transfer gates and high conversion gain (mu V/e-) in a floating diffusion node. It is, to our best knowledge, the smallest global shutter pixel ever reported with superior pixel performances.
引用
收藏
页数:4
相关论文
共 50 条
  • [11] A 0.5 MP, 3D-Stacked, Voltage-Domain Global Shutter Image Sensor with NIR QE Enhancement, Event Detection Modes, and 90 dB Dynamic Range
    Xhakoni, Adi
    SENSORS, 2023, 23 (23)
  • [12] 0.9μm Pitch Pixel CMOS Image Sensor Design Methodology
    Itonaga, Kazuichiroh
    Mizuta, Kyohei
    Kataoka, Toyotaka
    Yanagita, Masashi
    Yamauchi, Shintaro
    Ikeda, Harumi
    Haruta, Tsutomu
    Matsumoto, Shizunori
    Harasawa, Masanori
    Matsuda, Takeshi
    Matsumoto, Akira
    Mizuno, Ikue
    Kameshima, Takatoshi
    Sugiura, Iwao
    Umebayashi, Taku
    Ohno, Keiichi
    Hirayama, Teruo
    2009 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, 2009, : 519 - +
  • [13] A 6.9-μm Pixel-Pitch Back-Illuminated Global Shutter CMOS Image Sensor With Pixel-Parallel 14-Bit Subthreshold ADC
    Sakakibara, Masaki
    Ogawa, Koji
    Sakai, Shin
    Tochigi, Yasuhisa
    Honda, Katsumi
    Kikuchi, Hidekazu
    Wada, Takuya
    Kamikubo, Yasunobu
    Miura, Tsukasa
    Nakamizo, Masahiko
    Jyo, Naoki
    Hayashibara, Ryo
    Miyata, Shinya
    Yamamoto, Satoshi
    Ota, Yoshiyuki
    Takahashi, Hirotsugu
    Taura, Tadayuki
    Oike, Yusuke
    Tatani, Keiji
    Ezaki, Takayuki
    Hirayama, Teruo
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2018, 53 (11) : 3017 - 3025
  • [14] A HDR 98dB 3.2μm Charge Domain Global Shutter CMOS Image Sensor
    Tournier, A.
    Roy, F.
    Cazaux, Y.
    Lalanne, F.
    Malinge, P.
    Mcdonald, M.
    Monnot, G.
    Roux, N.
    2018 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2018,
  • [15] A 1/2.3inch 20Mpixel 3-Layer Stacked CMOS Image Sensor with DRAM
    Haruta, Tsutomu
    Nakajima, Tsutomu
    Hashizume, Jun
    Umebayashi, Taku
    Takahashi, Hiroshi
    Taniguchi, Kazuo
    Kuroda, Masami
    Sumihiro, Hiroshi
    Enoki, Koji
    Yamasaki, Takatsugu
    Ikezawa, Katsuya
    Kitahara, Atsushi
    Zen, Masao
    Oyama, Masafumi
    Koga, Hiroki
    Tsugawa, Hidenobu
    Ogita, Tomoharu
    Nagano, Takashi
    Takano, Satoshi
    Nomoto, Tetsuo
    2017 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE (ISSCC), 2017, : 76 - 76
  • [16] A Global Shutter High Speed TDI CMOS Image Sensor With Pipelined Charge Transfer Pixel
    Xu, Jiangtao
    Shi, Xiaolin
    Nie, Kaiming
    Gao, Zhiyuan
    IEEE SENSORS JOURNAL, 2018, 18 (07) : 2729 - 2736
  • [17] An Improved Global Shutter Pixel with Extended Output Range and Linearity of Compensation for CMOS Image Sensor
    Guo Zhongjie
    Yu Ningmei
    Wu Longsheng
    CHINESE JOURNAL OF ELECTRONICS, 2021, 30 (01) : 102 - 108
  • [18] An 8T global shutter pixel with extended output range for CMOS image sensor
    Zhang, Qian
    Guo, Zhongjie
    2019 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC), 2019,
  • [19] A 2.1e- Temporal Noise and-105dB Parasitic Light Sensitivity Backside-Illuminated 2.3μm-Pixel Voltage-Domain Global Shutter CMOS Image Sensor Using High-Capacity DRAM Capacitor Technology
    Lee, Jae-kyu
    Kim, Seung Sik
    Baek, In-Gyu
    Shim, Heesung
    Kim, Taehoon
    Kim, Taehyoung
    Kyoung, Jungchan
    Im, Dongmo
    Choi, Jinyong
    Cho, KeunYeong
    Kim, Daehoon
    Lim, Haemin
    Seo, Min-Woong
    Kim, JuYoung
    Kwon, Doowon
    Song, Jiyoun
    Kim, Jiyoon
    Jang, Minho
    Moon, Joosung
    Kim, HyunChul
    Chang, Chong Kwang
    Kim, JinGyun
    Koh, Kyoungmin
    Lim, HanJin
    Ahn, JungChak
    Hong, Hyeongsun
    Lee, Kyupil
    Kang, Ho-Kyu
    2020 IEEE INTERNATIONAL SOLID- STATE CIRCUITS CONFERENCE (ISSCC), 2020, : 102 - +
  • [20] An Improved Global Shutter Pixel with Extended Output Range and Linearity of Compensation for CMOS Image Sensor
    GUO Zhongjie
    YU Ningmei
    WU Longsheng
    Chinese Journal of Electronics, 2021, 30 (01) : 102 - 108