Electronic structure of Mott insulators studied by inelastic X-ray scattering

被引:178
|
作者
Hasan, MZ [1 ]
Isaacs, ED
Shen, ZX
Miller, LL
Tsutsui, K
Tohyama, T
Maekawa, S
机构
[1] Stanford Univ, Stanford Synchrotron Radiat Lab, Dept Appl Phys, Stanford, CA 94305 USA
[2] Stanford Univ, Stanford Linear Accelerator Ctr, Stanford, CA 94305 USA
[3] Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA
[4] Iowa State Univ, Dept Phys, Ames, IA 50011 USA
[5] Iowa State Univ, Ames Lab, Ames, IA 50011 USA
[6] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan
关键词
D O I
10.1126/science.288.5472.1811
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
The electronic structure of Mott insulators continues to be a major unsolved problem in physics despite more than 50 years of research. Well-developed momentum-resolved spectroscopies such as photoemission or neutron scattering cannot probe the full Mott gap. High-resolution resonant inelastic x-ray scattering revealed dispersive charge excitations across the Mott gap in a high-critical temperature parent cuprate (Ca2CuO2Cl2), shedding Light on the anisotropy of the Mott gap. These charge excitations across the Mott gap can be described within the framework of the Hubbard model.
引用
收藏
页码:1811 / 1814
页数:4
相关论文
共 50 条
  • [1] Inelastic X-ray scattering in correlated Mott insulators
    Devereaux, TP
    McCormack, GED
    Freericks, JK
    [J]. PHYSICAL REVIEW LETTERS, 2003, 90 (06)
  • [2] Electronic structure of MnS studied by resonant inelastic soft X-ray scattering
    Zhou Ke-Jin
    Tezuka, Yasuhisa
    Cui Ming-Qi
    Ma Chen-Yan
    Zhao Yi-Dong
    Wu Zi-Yu
    Yagishita, Akira
    [J]. ACTA PHYSICA SINICA, 2007, 56 (05) : 2986 - 2991
  • [3] Electronic structure of doped lanthanum cuprates studied with resonant inelastic x-ray scattering
    Ellis, D. S.
    Kim, Jungho
    Zhang, Harry
    Hill, J. P.
    Gu, Genda
    Komiya, Seiki
    Ando, Yoichi
    Casa, D.
    Gog, T.
    Kim, Young-June
    [J]. PHYSICAL REVIEW B, 2011, 83 (07):
  • [4] Electronic structure of Gd hydrides studied by resonant Inelastic soft X-ray scattering
    Kvashnina, KO
    Butorin, SM
    Nordgren, J
    Guo, JH
    Hjörvarsson, B
    [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2004, 137 : 487 - 489
  • [5] Resonant inelastic x-ray scattering in a Mott insulator
    Pakhira, Nandan
    Freericks, J. K.
    Shvaika, A. M.
    [J]. PHYSICAL REVIEW B, 2012, 86 (12)
  • [6] Inelastic X-ray scattering as a novel tool to study electronic excitations in complex insulators
    Hasan, MZ
    Isaacs, E
    Shen, ZX
    Miller, LL
    [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2001, 114 : 705 - 709
  • [7] Momentum resolved resonant inelastic X-ray scattering as a novel tool to study electronic structure of complex insulators
    Hasan, MZ
    Isaacs, ED
    Shen, ZX
    [J]. PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2001, 364 (364-365): : 265 - 268
  • [8] Electronic structure of single-wall carbon nanotubes studied by resonant inelastic X-ray scattering
    Eisebitt, S
    Karl, A
    Eberhardt, W
    Fischer, JE
    Sathe, C
    Agui, A
    Nordgren, J
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 67 (01): : 89 - 93
  • [9] Electronic structure of single-wall carbon nanotubes studied by resonant inelastic X-ray scattering
    S. Eisebitt
    A. Karl
    W. Eberhardt
    J.E. Fischer
    C. Sathe
    A. Agui
    J. Nordgren
    [J]. Applied Physics A, 1998, 67 : 89 - 93
  • [10] Electronic structure in thin film organic semiconductors studied using soft X-ray emission and resonant inelastic X-ray scattering
    Zhang, Yufeng
    Downes, James E.
    Wang, Shancai
    Learmonth, Timothy
    Plucinski, Lukasz
    Matsuura, A. Y.
    McGuinness, Cormac
    Glans, Per-Anders
    Bernardis, Sarah
    O'Donnell, Cian
    Smith, Kevin E.
    [J]. THIN SOLID FILMS, 2006, 515 (02) : 394 - 400