Spectroscopic Inspection Optimization for Edge Computing in Industry 4.0

被引：0
|
作者：
Konishi, Tsuyoshi [1 ]
Nakamichi, Takuya [1 ]
Kamikawa, Ryohei [1 ]
Yamasaki, Yu [1 ]
机构：
[1] Osaka Univ, 2-1 Yamadaoka, Suita, Osaka 5650871, Japan
来源：
2020 22ND INTERNATIONAL CONFERENCE ON TRANSPARENT OPTICAL NETWORKS (ICTON 2020) | 2020年
关键词：
Internet of things; edge device optimization; Industry; 4.0; real time spectroscopic inspection; QUALITY;
D O I：
10.1109/icton51198.2020.9203553
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We discuss a new spectroscopic inspection approach as a distinctive example of IoT and IIoT device optimization from the viewpoint of edge computing in Industry 4.0 and olive oil inspection is experimentally demonstrated.
引用
收藏
页数：4
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