Accelerated ageing tests on composite hollow insulators under DC voltages - Reply

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作者：
Petrusch, W
Weck, KH
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来源：
EUROPEAN TRANSACTIONS ON ELECTRICAL POWER | 1997年 / 7卷 / 05期
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
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页码：362 / 362
页数：1
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