Test Quality Improvement with Timing-aware ATPG: Screening small delay defect case study

被引：0

作者：

Chang, Che-Jen ^{[1
]}

Kobayashi, Takeo ^{[2
]}

机构：

[1] AMD, DTV Div, ASIC Design, SMTS, 33 Commerce Valley Dr E, Markham, ON L3T 3N6, Canada

[2] Mentor Graph Corp, Tech Mkt Engineer, Wilsonville, OR 97070 USA

来源：

2008 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, PROCEEDINGS | 2008年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Silicon results from 512K sample chips tested with Timing-aware ATPG are presented. We had 4040 unique detections from 86K timing-aware pattern. We will also show ATPG results and estimate the quality impact of timing-aware ATPG.

引用

页码：1058 / 1058

页数：1

共 13 条

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