Shape memory effect of a tungsten tailings microcrystalline glass

被引：0
|
作者：
Sun, XH [1 ]
Li, ST [1 ]
Wang, MP [1 ]
Cao, XL [1 ]
机构：
[1] CENT S UNIV TECHNOL,DEPT MAT SCI & ENGN,CHANGSHA 410083,PEOPLES R CHINA
来源：
TRANSACTIONS OF NONFERROUS METALS SOCIETY OF CHINA | 1997年 / 7卷 / 02期
关键词：
tungsten tailings; microcrystalline glass; shape memory effect; high-temperature x-ray diffraction;
D O I：
暂无
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
The shape memory effect(SME) of a tungsten tailings microcrystalline glass has been studied. Phase identification was performed using an X-ray diffractometer. The results show that the tungsten tailings microcrystalline glass has obvious SME and the SME is closely related with the main crystallization phase beta-CaSiO3 and a little amount of CaMg(SiO3)(2); that the strain recovery ratio increases with increasing recovery temperature, i.e. the higher the temperature, the faster the memory recovery, then the larger the strain recovery; that with decreasing deformation of the material, the shape recovery ratio increases.
引用
收藏
页码：67 / 70
页数：4
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