Surface transmission electron microscopy on structures with truncation

被引：2
|
作者：
Takayanagi, K [1 ]
Naitoh, Y [1 ]
Oshima, Y [1 ]
Mitome, M [1 ]
机构：
[1] NATL INST RES INORGAN MAT, TSUKUBA, IBARAKI 305, JAPAN
来源：
SURFACE REVIEW AND LETTERS | 1997年 / 4卷 / 04期
关键词：
D O I：
10.1142/S0218625X97000687
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Surface transmission electron microscopy (TEM) has been used to reveal surface steps and structures by bright and dark field imaging, and high resolution plan view and/or profile view imaging. Dynamic processes on surfaces, such as step motion, surface phase transitions and film growths, are visualized by a TV system attached to the electron microscope. Atom positions can precisely be detected by convergent beam illumination (CBI) of high resolution surface TEM. Imaging of the atomic positions of surfaces with truncation is briefly reviewed in this paper, with recent development of a TEM-STM (scanning tunneling microscope) system.
引用
收藏
页码：687 / 694
页数：8
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