High photoluminescence quantum efficiency InGaN multiple quantum well structures emitting at 380 nm

被引:11
|
作者
Graham, D. M.
Dawson, P.
Chabrol, G. R.
Hylton, N. P.
Zhu, D.
Kappers, M. J.
McAleese, C.
Humphreys, C. J.
机构
[1] Univ Manchester, Sch Phys & Astron, Manchester M60 1QD, Lancs, England
[2] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England
基金
英国工程与自然科学研究理事会;
关键词
D O I
10.1063/1.2434823
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this paper we report the design of high room temperature photoluminescence internal efficiency InGaN-based quantum well structures emitting in the near ultraviolet at 380 nm. To counter the effects of nonradiative recombination the quantum wells were designed to have a large indium fraction, high barriers, and a small quantum well thickness. To minimize the interwell and interbarrier thickness fluctuations we used Al0.2In0.005Ga0.795N barriers, where the inclusion of the small fraction of indium was found to lead to fewer structural defects and a reduction in the layer thickness fluctuations. This approach has led us to achieve, for an In0.08Ga0.92N/Al0.2In0.005Ga0.795N multiple quantum well structure with a well width of 1.5 nm, a photoluminescence internal efficiency of 67% for peak emission at 382 nm at room temperature. (c) 2007 American Institute of Physics.
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页数:5
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