共 50 条
- [42] Aperiodic W/B4C multilayer systems for X-ray optics: Quantitative determination of layer thickness by HAADF-STEM and X-ray reflectivity SURFACE & COATINGS TECHNOLOGY, 2010, 204 (12-13): : 1929 - 1932
- [46] Quantitative determination of grain boundary recombination velocity in CdTe by combination of cathodoluminescence measurements and numerical simulations 2015 IEEE 42ND PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC), 2015,
- [47] Quantitative Determination of Grain-Boundary Recombination Velocity in CdTe by Cathodoluminescence Measurements and Numerical Simulations IEEE JOURNAL OF PHOTOVOLTAICS, 2015, 5 (06): : 1722 - 1726
- [48] GRAIN-BOUNDARY THICKNESS IN ICE AS DETERMINED FROM DIELECTRIC MEASUREMENTS BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1979, 24 (01): : 59 - 59