Fault Isolation Based on k-Nearest Neighbor Rule for Industrial Processes

被引:104
|
作者
Zhou, Zhe [1 ]
Wen, Chenglin [2 ]
Yang, Chunjie [1 ]
机构
[1] Zhejiang Univ, Inst Ind Proc Control, State Key Lab Ind Control Technol, Hangzhou 310027, Zhejiang, Peoples R China
[2] Hangzhou Dianzi Univ, Inst Syst Sci & Control Engn, Hangzhou 310018, Zhejiang, Peoples R China
基金
中国国家自然科学基金;
关键词
Fault isolation; fault smearing; industrial alarm systems; k-nearest neighbor (kNN) rule; multiple sensor faults; RECONSTRUCTION-BASED CONTRIBUTION;
D O I
10.1109/TIE.2016.2520898
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Recently, the well-known k-nearest neighbor (kNN) rule has been successfully applied to the fault detection of industrial processes with nonlinear, multimode, and non-Gaussian distributed data. Once a fault is detected, how to investigate the root causes of the fault by isolating the true faulty variables without any historical fault information is a challenging problem. Inspired by the idea of the contribution analysis (CA) methods developed in the frame of the principal component analysis (PCA), in this paper, a novel isolation index will be provided by decomposing the kNN distance used as the detection index in kNN-based fault detection method. The commonly used CA-based isolation methods suffer from smearing effect due to the correlation among the defined isolation indices, thus prone to misdiagnosis. The proposed isolation index is defined in the original measurement space without correlation. Moreover, theoretical analysis of the isolability for the proposed fault isolation method shows that it can isolate multiple sensor faults under a less strict condition than that used in the analysis of those CA-based fault isolation methods. The numerical examples and Tennessee Eastman (TE) benchmark process are used to illustrate the effectiveness of the proposed method.
引用
收藏
页码:2578 / 2586
页数:9
相关论文
共 50 条
  • [1] Fault diagnosis of industrial processes based on weighted k-nearest neighbor reconstruction analysis
    Wang, Guo-Zhu
    Liu, Jian-Chang
    Li, Yuan
    Shang, Liang-Liang
    Kongzhi Lilun Yu Yingyong/Control Theory and Applications, 2015, 32 (07): : 873 - 880
  • [2] Fault detection using the k-nearest neighbor rule for semiconductor manufacturing processes
    He, Q. Peter
    Wang, Jin
    IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2007, 20 (04) : 345 - 354
  • [3] Quality-related fault diagnosis based on k-nearest neighbor rule for non-linear industrial processes
    Ren, Zelin
    Tang, Yongqiang
    Zhang, Wensheng
    INTERNATIONAL JOURNAL OF DISTRIBUTED SENSOR NETWORKS, 2021, 17 (11)
  • [4] A GENERALIZED K-NEAREST NEIGHBOR RULE
    PATRICK, EA
    FISCHER, FP
    INFORMATION AND CONTROL, 1970, 16 (02): : 128 - &
  • [5] Fault Detection Using Random Projections and k-Nearest Neighbor Rule for Semiconductor Manufacturing Processes
    Zhou, Zhe
    Wen, Chenglin
    Yang, Chunjie
    IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2015, 28 (01) : 70 - 79
  • [6] A Novel Fault Detection Scheme Based on Mutual k-Nearest Neighbor Method: Application on the Industrial Processes with Outliers
    Wang, Jian
    Zhou, Zhe
    Li, Zuxin
    Du, Shuxin
    PROCESSES, 2022, 10 (03)
  • [7] Fault Diagnosis Based on LTSA and K-Nearest Neighbor Classifier
    Jiang, Jingsheng
    Wang, Huaqing
    Ke, Yanliang
    Xiang, Wei
    Zhendong yu Chongji/Journal of Vibration and Shock, 2017, 36 (11): : 134 - 139
  • [8] A feature space adaptive k-nearest neighbor method for industrial fault detection
    Guo X.-P.
    Xu Y.
    Li Y.
    Gao Xiao Hua Xue Gong Cheng Xue Bao/Journal of Chemical Engineering of Chinese Universities, 2019, 33 (02): : 453 - 461
  • [9] Fault Detection and Isolation of a Pressurized Water Reactor Based on Neural Network and K-Nearest Neighbor
    Naimi, Amine
    Deng, Jiamei
    Shimjith, S. R.
    Arul, A. John
    IEEE ACCESS, 2022, 10 : 17113 - 17121
  • [10] A Proposal for Local k Values for k-Nearest Neighbor Rule
    Garcia-Pedrajas, Nicolas
    Romero del Castillo, Juan A.
    Cerruela-Garcia, Gonzalo
    IEEE TRANSACTIONS ON NEURAL NETWORKS AND LEARNING SYSTEMS, 2017, 28 (02) : 470 - 475