Total Projection to Latent Structures for Process Monitoring

被引:405
|
作者
Zhou, Donghua [2 ]
Li, Gang [2 ]
Qin, S. Joe [1 ]
机构
[1] Univ So Calif, Ming Hsieh Dept Elect Engn, Mork Family Dept Chem Engn & Mat Sci, Los Angeles, CA 90089 USA
[2] Tsinghua Univ, TNList, Dept Automat, Beijing 100084, Peoples R China
关键词
partial least squares; process monitoring; total PLS; orthogonal PLS; fault detection; PARTIAL LEAST-SQUARES; FAULT-DIAGNOSIS; PLS; PCA;
D O I
10.1002/aic.11977
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
Partial least squares or projection to latent structures (PLS) has been used in multivariate statistical process monitoring similar to principal component analysis. Standard PLS often requires many components or latent variables (LVs), which contain variations orthogonal to Y and useless for predicting Y. Further, the X-residual of PLS usually has quite large variations, thus is not proper to monitor with the Q-statistic. To reduce false alarm and missing alarm rates of faults related to Y, a total projection to latent structures (T-PLS) algorithm is proposed in this article. The new structure divides the X-space into four parts instead of two parts in standard PLS. The properties of T-PLS are studied in detail, including its relationship to the orthogonal PLS. Further study shows the space decomposition on X-space induced by T-PLS. Fault detection policy is developed based on the T-PLS. Case studies on two simulation examples show the effectiveness of the T-PLS based fault detection methods. (C) 2009 American Institute of Chemical Engineers AIChE J, 56: 168-178, 2010
引用
收藏
页码:168 / 178
页数:11
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