Total Projection to Latent Structures for Process Monitoring

被引:405
|
作者
Zhou, Donghua [2 ]
Li, Gang [2 ]
Qin, S. Joe [1 ]
机构
[1] Univ So Calif, Ming Hsieh Dept Elect Engn, Mork Family Dept Chem Engn & Mat Sci, Los Angeles, CA 90089 USA
[2] Tsinghua Univ, TNList, Dept Automat, Beijing 100084, Peoples R China
关键词
partial least squares; process monitoring; total PLS; orthogonal PLS; fault detection; PARTIAL LEAST-SQUARES; FAULT-DIAGNOSIS; PLS; PCA;
D O I
10.1002/aic.11977
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
Partial least squares or projection to latent structures (PLS) has been used in multivariate statistical process monitoring similar to principal component analysis. Standard PLS often requires many components or latent variables (LVs), which contain variations orthogonal to Y and useless for predicting Y. Further, the X-residual of PLS usually has quite large variations, thus is not proper to monitor with the Q-statistic. To reduce false alarm and missing alarm rates of faults related to Y, a total projection to latent structures (T-PLS) algorithm is proposed in this article. The new structure divides the X-space into four parts instead of two parts in standard PLS. The properties of T-PLS are studied in detail, including its relationship to the orthogonal PLS. Further study shows the space decomposition on X-space induced by T-PLS. Fault detection policy is developed based on the T-PLS. Case studies on two simulation examples show the effectiveness of the T-PLS based fault detection methods. (C) 2009 American Institute of Chemical Engineers AIChE J, 56: 168-178, 2010
引用
收藏
页码:168 / 178
页数:11
相关论文
共 50 条
  • [1] AutoRegressive Total Projection to Latent Structures for Process Monitoring
    Yuan Tianqi
    Hu Jing
    Wen Chenglin
    2013 32ND CHINESE CONTROL CONFERENCE (CCC), 2013, : 6267 - 6271
  • [2] Multispace Total Projection to Latent Structures and its Application to Online Process Monitoring
    Zhao, Chunhui
    Sun, Youxian
    IEEE TRANSACTIONS ON CONTROL SYSTEMS TECHNOLOGY, 2014, 22 (03) : 868 - 883
  • [3] Improved Projection to Latent Structures for Quality-Relevant Process Monitoring
    Liu, Ziwei
    Zheng, Ying
    2015 CHINESE AUTOMATION CONGRESS (CAC), 2015, : 875 - 879
  • [4] Parallel projection to latent structures for quality-relevant process monitoring
    Zheng, Ying
    Liu, Ziwei
    Yang, Weidong
    Tao, Bo
    Wan, Yanwei
    JOURNAL OF THE TAIWAN INSTITUTE OF CHEMICAL ENGINEERS, 2017, 80 : 76 - 84
  • [5] Fault Monitoring of Nonlinear Process Based on kernel concurrent projection to latent structures
    Sun, Rongrong
    Fan, Yunpeng
    Zhang, Yingwei
    2014 33RD CHINESE CONTROL CONFERENCE (CCC), 2014, : 5184 - 5189
  • [6] A process monitoring method for autoregressive-dynamic inner total latent structure projection
    CHEN Yalin
    KONG Xiangyu
    LUO Jiayu
    Journal of Systems Engineering and Electronics, 2024, 35 (05) : 1326 - 1336
  • [7] A Process Monitoring Method for Autoregressive-Dynamic Inner Total Latent Structure Projection
    Chen, Yalin
    Kong, Xiangyu
    Luo, Jiayu
    JOURNAL OF SYSTEMS ENGINEERING AND ELECTRONICS, 2024, 35 (05) : 1326 - 1336
  • [8] The Multi-space Generalization of Total Projection to Latent Structures (MsT-PLS) and Its Application to Online Process Monitoring
    Zhao, Chunhui
    Sun, Youxian
    2013 10TH IEEE INTERNATIONAL CONFERENCE ON CONTROL AND AUTOMATION (ICCA), 2013, : 1441 - 1446
  • [9] Quality-Relevant and Process-Relevant Fault Monitoring with Concurrent Projection to Latent Structures
    Qin, S. Joe
    Zheng, Yingying
    AICHE JOURNAL, 2013, 59 (02) : 496 - 504
  • [10] Process monitoring for covariance matrices with latent structures
    Zou, Qing
    Li, Jian
    Ding, Dong
    Tsung, Fugee
    IISE TRANSACTIONS, 2024,